Dokken; Richard C

Patent Applications and Registrations

Patent applications and USPTO patent grants for Dokken; Richard C.The latest application filed is for "method for operating a secure semiconductor ip server to support failure analysis".

Company Profile

0.10.7

Dokken; Richard C - San Ramon CA US
Dokken; Richard C. - San Ramon CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Process for improving design-limited yield by localizing potential faults from production test data Grant 8,615,691 - Dokken , et al. December 24, 2	2013-12-24
Process for improving design limited yield by efficiently capturing and storing production test data for analysis using checksums, hash values, or digital fault signatures Grant 8,453,026 - Chan , et al. May 28, 2	2013-05-28
Method for operating a secure semiconductor IP server to support failure analysis Grant 8,060,851 - Dokken , et al. November 15, 2	2011-11-15
Methods for analyzing scan chains, and for determining numbers or locations of hold time faults in scan chains Grant 8,010,856 - Cannon , et al. August 30, 2	2011-08-30
System and method for device performance characterization in physical and logical domains with AC SCAN testing Grant 8,006,149 - Dokken , et al. August 23, 2	2011-08-23
Locating hold time violations in scan chains by generating patterns on ATE Grant 7,853,846 - Cannon , et al. December 14, 2	2010-12-14
Method For Operating A Secure Semiconductor Ip Server To Support Failure Analysis App 20100031092 - DOKKEN; RICHARD C. ; et al.	2010-02-04
Process for identifying the location of a break in a scan chain in real time Grant 7,568,139 - Dokken , et al. July 28, 2	2009-07-28
Locating Hold Time Violations In Scan Chains By Generating Patterns On Ate App 20090113265 - Cannon; Stephen A. ; et al.	2009-04-30
Methods For Analyzing Scan Chains, And For Determining Numbers Or Locations Of Hold Time Faults In Scan Chains App 20090113263 - Cannon; Stephen A. ; et al.	2009-04-30
Process For Identifying The Location Of A Break In A Scan Chain In Real Time App 20080141085 - Dokken; Richard C. ; et al.	2008-06-12
System and Method for Device Performance Characterization in Physical and Logical Domains with AC SCAN Testing App 20080126896 - Dokken; Richard C. ; et al.	2008-05-29
Process for improving design limited yield by efficiently capturing and storing production test data for analysis using checksums, hash values, or digital fault signatures App 20080104468 - CHAN; GERALD S. ; et al.	2008-05-01
Process For Improving Design-limited Yield By Localizing Potential Faults From Production Test Data App 20080091981 - DOKKEN; RICHARD C. ; et al.	2008-04-17
Method and system for automatically determining a testing order when executing a test flow Grant 7,047,463 - Organ , et al. May 16, 2	2006-05-16

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