Doi; Hideaki

Patent Applications and Registrations

Patent applications and USPTO patent grants for Doi; Hideaki.The latest application filed is for "method of inspecting pattern and apparatus thereof".

Company Profile

0.17.2

Doi; Hideaki - Oota-ku JP
Doi; Hideaki - Tokyo JP
Doi; Hideaki - Yokohama JP
Doi; Hideaki - Matsudo JP
Doi; Hideaki - Iwaki JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Pattern inspecting method and apparatus thereof, and pattern inspecting method on basis of electron beam images and apparatus thereof Grant 7,263,216 - Shishido , et al. August 28, 2	2007-08-28
Inspection system for circuit patterns and a method thereof Grant 6,831,998 - Koshishiba , et al. December 14, 2	2004-12-14
Semiconductor device producing method, system for carrying out the same and semiconductor work processing apparatus included in the same system Grant 6,650,409 - Noguchi , et al. November 18, 2	2003-11-18
Method monitoring a quality of electronic circuits and its manufacturing condition and system for it Grant 6,622,054 - Okuda , et al. September 16, 2	2003-09-16
Pattern inspecting method and apparatus thereof, and pattern inspecting method on basis of electron beam images and apparatus thereof Grant 6,614,923 - Shishido , et al. September 2, 2	2003-09-02
Method of inspecting a pattern on a substrate Grant 6,376,854 - Shishido , et al. April 23, 2	2002-04-23
Method of inspecting pattern and apparatus thereof App 20010030300 - Shishido, Chie ; et al.	2001-10-18
Method and system for manufacturing semiconductor devices, and method and system for inspecting semiconductor devices App 20010020194 - Takagi, Yuji ; et al.	2001-09-06
Three-dimensional imaging system, game device, method for same and recording medium Grant 6,278,418 - Doi A	2001-08-21
Method of inspecting pattern and apparatus thereof with a differential brightness image detection Grant 6,236,057 - Shishido , et al. May 22, 2	2001-05-22
Method of inspecting pattern and apparatus thereof Grant 6,087,673 - Shishido , et al. July 11, 2	2000-07-11
Method and device of inspecting three-dimensional shape defect Grant 6,072,899 - Irie , et al. June 6, 2	2000-06-06
Wiring pattern inspecting method and system for carrying out the same Grant 5,930,382 - Irie , et al. July 27, 1	1999-07-27
Method and system for manufacturing semiconductor devices, and method and system for inspecting semiconductor devices Grant 5,801,965 - Takagi , et al. September 1, 1	1998-09-01
X-ray inspection method and apparatus, prepreg inspecting method, and method for fabricating multi-layer printed circuit board Grant 5,754,621 - Suzuki , et al. May 19, 1	1998-05-19
Optical material Grant 4,975,223 - Doi , et al. December 4, 1	1990-12-04
Pattern inspection system Grant 4,908,871 - Hara , et al. March 13, 1	1990-03-13
Pattern checking apparatus Grant 4,628,531 - Okamoto , et al. December 9, 1	1986-12-09
Laminar thermoplastic resin structure Grant 4,341,837 - Katsuto , et al. July 27, 1	1982-07-27

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