Doherty; C. Patrick

Patent Applications and Registrations

Patent applications and USPTO patent grants for Doherty; C. Patrick.The latest application filed is for "methods, devices, and systems for selectable repair of imaging devices".

Company Profile

0.13.4

Doherty; C. Patrick - Boise ID

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Methods, devices, and systems for selectable repair of imaging devices App 20070291145 - Doherty; C. Patrick ; et al.	2007-12-20
Probe card for semiconductor wafers having mounting plate and socket Grant 7,250,780 - Hembree , et al. July 31, 2	2007-07-31
Method and system having switching network for testing semiconductor components on a substrate Grant 6,853,211 - Doherty , et al. February 8, 2	2005-02-08
Method for testing semiconductor wafers Grant 6,798,224 - Hembree , et al. September 28, 2	2004-09-28
Probe card for semiconductor wafers and method and system for testing wafers App 20040132222 - Hembree, David R. ; et al.	2004-07-08
Method and system having switching network for testing semiconductor components on a substrate App 20040021480 - Doherty, C. Patrick ; et al.	2004-02-05
Method and system having switching network for testing semiconductor components on a substrate Grant 6,677,776 - Doherty , et al. January 13, 2	2004-01-13
Method and system having switching network for testing semiconductor components on a substrate App 20020196047 - Doherty, C. Patrick ; et al.	2002-12-26
Probe card having on-board multiplex circuitry for expanding tester resources Grant 6,366,112 - Doherty , et al. April 2, 2	2002-04-02
Probe card and test system for semiconductor wafers Grant 6,359,456 - Hembree , et al. March 19, 2	2002-03-19
Probe card, test method and test system for semiconductor wafers Grant 6,356,098 - Akram , et al. March 12, 2	2002-03-12
Interconnect and system for testing bumped semiconductor components with on-board multiplex circuitry for expanding tester resources Grant 6,337,577 - Doherty , et al. January 8, 2	2002-01-08
Wafer test method with probe card having on-board multiplex circuitry for expanding tester resources Grant 6,300,786 - Doherty , et al. October 9, 2	2001-10-09
Probe card and testing method for semiconductor wafers Grant 6,275,052 - Hembree , et al. August 14, 2	2001-08-14
Probe card having on-board multiplex circuitry for expanding tester resources Grant 6,246,250 - Doherty , et al. June 12, 2	2001-06-12
Probe card, test method and test system for semiconductor wafers Grant 6,246,245 - Akram , et al. June 12, 2	2001-06-12
Probe card for semiconductor wafers and method and system for testing wafers Grant 6,060,891 - Hembree , et al. May 9, 2	2000-05-09

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