Patent | Date |
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Capacitive microsystem for recording mechanical deformations, use and operating method Grant 6,865,960 - Doemens , et al. March 15, 2 | 2005-03-15 |
Confocal imaging system having a divided retroreflector Grant 6,791,698 - Doemens , et al. September 14, 2 | 2004-09-14 |
Actuator-integrated force sensor Grant 6,772,647 - Doemens , et al. August 10, 2 | 2004-08-10 |
Confocal Imaging System Having A Divided Retroreflector App 20040080760 - Doemens, Guenter ;   et al. | 2004-04-29 |
Spatially resolving range-finding system Grant 6,636,300 - Doemens , et al. October 21, 2 | 2003-10-21 |
Arrangement and method for simultaneous measurement of the speed as well as the surface shape of moving objects Grant 6,614,536 - Doemens , et al. September 2, 2 | 2003-09-02 |
Capacitive microsystem for recording mechanical deformations, use and operating method App 20030115968 - Doemens, Guenter ;   et al. | 2003-06-26 |
Actuator-integrated force sensor App 20030074977 - Doemens, Guenter ;   et al. | 2003-04-24 |
Spatially resolving range-finding system App 20020003617 - Doemens, Guenter ;   et al. | 2002-01-10 |
Solder testing apparatus Grant 6,249,598 - Honda , et al. June 19, 2 | 2001-06-19 |
Method and apparatus for three-dimensional testing of printed circuitboards Grant 5,088,828 - Doemens , et al. February 18, 1 | 1992-02-18 |
Apparatus for electrical function testing of wiring matrices, particularly of printed circuit boards Grant 4,967,148 - Doemens , et al. October 30, 1 | 1990-10-30 |
Sensor for measurement of the torque acting on a rotating shaft Grant 4,941,363 - Doemens , et al. July 17, 1 | 1990-07-17 |
Apparatus for electrical function testing of wiring matrices, particularly of printed circuit boards Grant 4,897,598 - Doemens , et al. January 30, 1 | 1990-01-30 |
Device for the electrical function testing of wiring matrices, particularly of printed circuit boards Grant 4,891,578 - Doemens January 2, 1 | 1990-01-02 |
Method for high precision position measurement of two-dimensional structures Grant 4,814,626 - Doemens , et al. March 21, 1 | 1989-03-21 |
Automated opto-electronic test system for quality control of two-dimensional elements with high geometric figure density Grant 4,305,097 - Doemens , et al. December 8, 1 | 1981-12-08 |
Process for automatic alignment of two objects to be adjusted with respect to one another Grant 4,253,112 - Doemens February 24, 1 | 1981-02-24 |
Process and an apparatus for automatically recognizing the position of semiconductor elements Grant 4,238,780 - Doemens December 9, 1 | 1980-12-09 |