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Patent applications and USPTO patent grants for Dobbelaere; Wim.The latest application filed is for "process variation as die level traceability".
Patent | Date |
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Process variation as die level traceability Grant 11,233,013 - Lettens , et al. January 25, 2 | 2022-01-25 |
Process Variation As Die Level Traceability App 20200258844 - A1 | 2020-08-13 |
Process variation as die level traceability Grant 10,685,918 - Lettens , et al. | 2020-06-16 |
Process Variation As Die Level Traceability App 20200075499 - LETTENS; Jan Lucie Axel ;   et al. | 2020-03-05 |
Method to improve analog fault coverage using test diodes Grant 10,103,074 - Vanhooren , et al. October 16, 2 | 2018-10-16 |
Method To Improve Analog Fault Coverage Using Test Diodes App 20170077003 - VANHOOREN; Ronny ;   et al. | 2017-03-16 |
Recovery of precious metals from spent homogeneous catalysts Grant 9,249,477 - Dobbelaere , et al. February 2, 2 | 2016-02-02 |
Recovery of Precious Metals from Spent Homogeneous Catalysts App 20120118108 - Dobbelaere; Wim ;   et al. | 2012-05-17 |
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