DOBASHI; Takashi

Patent Applications and Registrations

Patent applications and USPTO patent grants for DOBASHI; Takashi.The latest application filed is for "charged particle beam apparatus and method for controlling charged particle beam apparatus".

Company Profile

2.3.7

DOBASHI; Takashi - Tokyo JP
Dobashi; Takashi - Kokubunji JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Charged Particle Beam Apparatus And Method For Controlling Charged Particle Beam Apparatus App 20220230844 - DOBASHI; Takashi ; et al.	2022-07-21
Charged Particle Beam Apparatus And Method Of Controlling Charged Particle Beam Apparatus App 20220216034 - DOBASHI; Takashi ; et al.	2022-07-07
Measurement system and method for setting observation conditions of measurement apparatus Grant 11,380,518 - Miwa , et al. July 5, 2	2022-07-05
Charged Particle Beam Device And Control Method Thereof App 20220059313 - Dobashi; Takashi ; et al.	2022-02-24
Measurement System and Method for Setting Observation Conditions of Measurement Apparatus App 20210407763 - MIWA; Takafumi ; et al.	2021-12-30
Charged particle beam application apparatus Grant 11,177,108 - Shirasaki , et al. November 16, 2	2021-11-16
Charged Particle Beam Application Apparatus App 20210005417 - Shirasaki; Yasuhiro ; et al.	2021-01-07
Charged particle beam device for moving an aperture having plurality of openings and sample observation method Grant 10,636,621 - Hanawa , et al.	2020-04-28
Charged Particle Beam Device and Sample Observation Method App 20180076004 - HANAWA; Akinari ; et al.	2018-03-15
Diffraction Pattern Capturing Method And Charged Particle Beam Device App 20110049344 - Dobashi; Takashi ; et al.	2011-03-03

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