loadpatents
Patent applications and USPTO patent grants for Doan; Kenny Linh.The latest application filed is for "using bias rf pulsing to effectively clean electrostatic chuck (esc)".
Patent | Date |
---|---|
Using bias RF pulsing to effectively clean electrostatic chuck (ESC) Grant 10,410,845 - Doan , et al. Sept | 2019-09-10 |
Using Bias Rf Pulsing To Effectively Clean Electrostatic Chuck (esc) App 20190157052 - DOAN; Kenny Linh ;   et al. | 2019-05-23 |
Boron-doped carbon-based hardmask etch processing Grant 9,129,911 - Doan , et al. September 8, 2 | 2015-09-08 |
Process Kit For Edge Critical Dimension Uniformity Control App 20150001180 - DOAN; Kenny Linh ;   et al. | 2015-01-01 |
Etch Process Having Adaptive Control With Etch Depth Of Pressure And Power App 20140342570 - Doan; Kenny Linh ;   et al. | 2014-11-20 |
Boron-doped Carbon-based Hardmask Etch Processing App 20140213059 - Doan; Kenny Linh ;   et al. | 2014-07-31 |
Plasma etch processes for boron-doped carbonaceous mask layers Grant 8,778,207 - Kim , et al. July 15, 2 | 2014-07-15 |
Method for etching substrate Grant 8,668,837 - Doan , et al. March 11, 2 | 2014-03-11 |
Method Of Etching High Aspect Ratio Features In A Dielectric Layer App 20130122712 - KIM; Jong Mun ;   et al. | 2013-05-16 |
Plasma Etch Processes For Boron-doped Carbonaceous Mask Layers App 20130109188 - KIM; Jong Mun ;   et al. | 2013-05-02 |
Method For Etching Substrate App 20130092656 - Doan; Kenny Linh ;   et al. | 2013-04-18 |
Methods For Forming High Aspect Ratio Features On A Substrate App 20100330805 - DOAN; KENNY LINH ;   et al. | 2010-12-30 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.