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Dikopoltsev; Alexander Patent Filings

Dikopoltsev; Alexander

Patent Applications and Registrations

Patent applications and USPTO patent grants for Dikopoltsev; Alexander.The latest application filed is for "x-ray reflectometry with small-angle scattering measurement".

Company Profile
0.4.4
  • Dikopoltsev; Alexander - Haifa IL
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
X-ray reflectometry with small-angle scattering measurement
Grant 6,895,075 - Yokhin , et al. May 17, 2
2005-05-17
XRR detector readout processing
Grant 6,895,071 - Yokhin , et al. May 17, 2
2005-05-17
X-ray reflectometry with small-angle scattering measurement
App 20040156474 - Yokhin, Boris ;   et al.
2004-08-12
X-ray reflectometer
App 20040028186 - Yokhin, Boris ;   et al.
2004-02-12
X-ray reflectometer
Grant 6,639,968 - Yokhin , et al. October 28, 2
2003-10-28
X-ray reflectometer
App 20030072413 - Yokhin, Boris ;   et al.
2003-04-17
X-ray reflectometer
Grant 6,512,814 - Yokhin , et al. January 28, 2
2003-01-28
X-ray reflectometer
App 20020150208 - Yokhin, Boris ;   et al.
2002-10-17

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