Dighe; Prasanna

Patent Applications and Registrations

Patent applications and USPTO patent grants for Dighe; Prasanna.The latest application filed is for "process-induced displacement characterization during semiconductor production".

Company Profile

3.6.6

Dighe; Prasanna - San Ramon CA
Dighe; Prasanna - Milpitas CA
Dighe; Prasanna - Fremont CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Multi-spot analysis system with multiple optical probes Grant 11,441,893 - Dighe , et al. September 13, 2	2022-09-13
Process-Induced Displacement Characterization During Semiconductor Production App 20220005714 - Vukkadala; Pradeep ; et al.	2022-01-06
Process-induced displacement characterization during semiconductor production Grant 11,164,768 - Vukkadala , et al. November 2, 2	2021-11-02
Removable opaque coating for accurate optical topography measurements on top surfaces of transparent films Grant 11,049,720 - Mueller , et al. June 29, 2	2021-06-29
Removable Opaque Coating For Accurate Optical Topography Measurements On Top Surfaces Of Transparent Films App 20200126786 - Mueller; Dieter ; et al.	2020-04-23
Statistical overlay error prediction for feed forward and feedback correction of overlay errors, root cause analysis and process control Grant 10,545,412 - Chang , et al. Ja	2020-01-28
Process-Induced Displacement Characterization During Semiconductor Production App 20190333794 - Vukkadala; Pradeep ; et al.	2019-10-31
Multi-Spot Analysis System with Multiple Optical Probes App 20190331592 - Dighe; Prasanna ; et al.	2019-10-31
Statistical Overlay Error Prediction for Feed Forward and Feedback Correction of Overlay Errors, Root Cause Analysis and Process Control App 20170017162 - Chang; Wei ; et al.	2017-01-19
Statistical overlay error prediction for feed forward and feedback correction of overlay errors, root cause analysis and process control Grant 9,087,176 - Chang , et al. July 21, 2	2015-07-21
Computer-implemented methods for inspecting and/or classifying a wafer Grant 8,269,960 - Reich , et al. September 18, 2	2012-09-18
Computer-implemented Methods For Inspecting And/or Classifying A Wafer App 20100060888 - Reich; Juergen ; et al.	2010-03-11

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