Dietrich; Claus

Patent Applications and Registrations

Patent applications and USPTO patent grants for Dietrich; Claus.The latest application filed is for "method and device for contacting a row of contact areas with probe tips".

Company Profile

0.14.20

Dietrich; Claus - Thiendorf OT Sacka N/A DE
Dietrich; Claus - Sacka DE
Dietrich; Claus - Thiendorf DE
Dietrich; Claus - Sacke DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and device for contacting a row of contact areas with probe tips Grant 9,110,131 - Dietrich , et al. August 18, 2	2015-08-18
Method for testing electronic components of a repetitive pattern under defined thermal conditions Grant 8,368,413 - Kanev , et al. February 5, 2	2013-02-05
Method And Device For Contacting A Row Of Contact Areas With Probe Tips App 20130027070 - Dietrich; Claus ; et al.	2013-01-31
Method for increasing the accuracy of the positioning of a first object relative to a second object Grant 8,094,925 - Schneidewind , et al. January 10, 2	2012-01-10
Method For Testing Electronic Components Of A Repetitive Pattern Under Defined Thermal Conditions App 20110221461 - Kanev; Stojan ; et al.	2011-09-15
Probe holder for a probe for testing semiconductor components Grant 7,859,278 - Runge , et al. December 28, 2	2010-12-28
Method For Increasing The Accuracy Of The Positioning Of A First Object Relative To A Second Object App 20100111403 - Schineidewind; Stefan ; et al.	2010-05-06
Method and apparatus for controlling the temperature of electronic components Grant 7,671,615 - van de Beek , et al. March 2, 2	2010-03-02
Method And Device For Forming A Temporary Electrical Contact To A Solar Cell App 20100045265 - KIESEWETTER; Jorg ; et al.	2010-02-25
Probe For Temporarily Electrically Contacting A Solar Cell App 20100045264 - KIESEWETTER; Jorg ; et al.	2010-02-25
Apparatus And Method For Assembling Several Semiconductor Devices Onto A Target Substrate App 20100011569 - DIETRICH; Claus ; et al.	2010-01-21
Probe station and method for measurements of semiconductor devices under defined atmosphere Grant 7,579,854 - Kiesewetter , et al. August 25, 2	2009-08-25
Method For Increasing The Accuracy Of The Positioning Of A First Object Relative To A Second Object App 20080298671 - Schneidewind; Stefan ; et al.	2008-12-04
Probe Station And Method For Measurements Of Semiconductor Devices Under Defined Atmosphere App 20080143365 - Kiesewetter; Jorg ; et al.	2008-06-19
Probe Holder For A Probe For Testing Semiconductor Components App 20080122465 - RUNGE; Dietmar ; et al.	2008-05-29
Method And Apparatus For Controlling The Temperature Of Electronic Components App 20080042679 - van de Beek; Carel ; et al.	2008-02-21
Apparatus for testing substrates Grant 7,196,507 - Schneidewind , et al. March 27, 2	2007-03-27
Method and prober for contacting a contact area with a contact tip Grant 7,057,408 - Schneidewind , et al. June 6, 2	2006-06-06
Test apparatus for testing substrates at low temperatures Grant 7,046,025 - Schneidewind , et al. May 16, 2	2006-05-16
Test apparatus with loading device Grant 7,038,441 - Stoll , et al. May 2, 2	2006-05-02
Apparatus for testing substrates App 20050083036 - Schneidewind, Stefan ; et al.	2005-04-21
Arrangement and method for testing substrates under load App 20050083037 - Schneidewind, Stefan ; et al.	2005-04-21
Substrate-holding device for testing circuit arrangements on substrates Grant 6,864,676 - Kiesewetter , et al. March 8, 2	2005-03-08
Method and prober for contacting a contact area with a contact tip App 20050007135 - Schneidewind, Stefan ; et al.	2005-01-13
Method for increasing the accuracy of the positioning of a first object relative to a second object App 20040208355 - Schneidewind, Stefan ; et al.	2004-10-21
Method and apparatus for testing movement-sensitive substrates App 20040119492 - Schneidewind, Stefan ; et al.	2004-06-24
Test apparatus with loading device App 20040108847 - Stoll, Karsten ; et al.	2004-06-10
Test apparatus for testing substrates at low temperatures App 20040070415 - Schneidewind, Stefan ; et al.	2004-04-15
Tester for pressure sensors Grant 6,688,156 - Dietrich , et al. February 10, 2	2004-02-10
Substrate-holding device for testing circuit arrangements on substrates App 20020163350 - Kiesewetter, Jorg ; et al.	2002-11-07
Tester for pressure sensors App 20020152794 - Dietrich, Claus ; et al.	2002-10-24

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