Dicker; Gerald

Patent Applications and Registrations

Patent applications and USPTO patent grants for Dicker; Gerald.The latest application filed is for "methods and apparatus for measuring a property of a substrate".

Company Profile

5.6.6

Dicker; Gerald - Taipei City TW
Dicker; Gerald - Taipei TW
Dicker; Gerald - Tillburg NL
Dicker; Gerald - Tilburg NL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Methods and Apparatus for Measuring a Property of a Substrate App 20210215622 - Elings; Wouter Lodewijk ; et al.	2021-07-15
Methods and apparatus for measuring a property of a substrate Grant 10,996,176 - Elings , et al. May 4, 2	2021-05-04
Methods and Apparatus for Measuring a Property of a Substrate App 20200319118 - ELINGS; Wouter Lodewijk ; et al.	2020-10-08
Methods and apparatus for measuring a property of a substrate Grant 10,746,668 - Elings , et al. A	2020-08-18
Methods and Apparatus for Measuring a Property of a Substrate App 20190301850 - ELINGS; Wouter Lodewijk ; et al.	2019-10-03
Methods and apparatus for measuring a property of a substrate Grant 10,317,191 - Elings , et al.	2019-06-11
Methods and Apparatus for Measuring a Property of a Substrate App 20170160073 - ELINGS; Wouter Lodewijk ; et al.	2017-06-08
Methods and apparatus for measuring a property of a substrate Grant 9,594,029 - Elings , et al. March 14, 2	2017-03-14
Methods and Apparatus for Measuring A Property of a Substrate App 20140354969 - Elings; Wouter Lodewijk ; et al.	2014-12-04
Device manufacturing method, method of making a mask, and mask Grant 8,652,710 - Dicker February 18, 2	2014-02-18
Device manufacturing method, method of making a mask, and mask App 20080292975 - Dicker; Gerald	2008-11-27

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