Dhagat; Parul
Patent Applications and Registrations
Patent applications and USPTO patent grants for Dhagat; Parul.The latest application filed is for "semiconductor wafer inspection using care area group-specific threshold settings for detecting defects".
- Dhagat; Parul - Clifton Park NY
- Dhagat; Parul - Halfmoon NY
| Patent | Date |
|---|---|
| Semiconductor wafer inspection using care area group-specific threshold settings for detecting defects Grant 10,146,036 - Dhagat , et al. De | 2018-12-04 |
| Semiconductor Wafer Inspection Using Care Area Group-specific Threshold Settings For Detecting Defects App 20170352145 - Dhagat; Parul ; et al. | 2017-12-07 |
| Using tensile mask to minimize buckling in substrate Grant 9,741,581 - Mahajan , et al. August 22, 2 | 2017-08-22 |
| Using Tensile Mask To Minimize Buckling In Substrate App 20170200614 - Mahajan; Sunit S. ; et al. | 2017-07-13 |
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