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name:-0.028103828430176
name:-0.030594110488892
name:-0.010446071624756
Devta Prasanna; Narendra B. Patent Filings

Devta Prasanna; Narendra B.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Devta Prasanna; Narendra B..The latest application filed is for "scan test circuitry configured to prevent violation of multiplexer select signal constraints during scan testing".

Company Profile
0.7.5
  • Devta Prasanna; Narendra B. - San Jose CA
  • Devta-Prasanna; Narendra B. - Milpitas CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Scan test circuitry configured to prevent violation of multiplexer select signal constraints during scan testing
Grant 8,819,508 - Devta Prasanna , et al. August 26, 2
2014-08-26
Scan Test Circuitry Configured To Prevent Violation Of Multiplexer Select Signal Constraints During Scan Testing
App 20140101501 - Devta Prasanna; Narendra B. ;   et al.
2014-04-10
Method and an apparatus for evaluating small delay defect coverage of a test pattern set on an IC
Grant 8,515,695 - Devta-Prasanna , et al. August 20, 2
2013-08-20
Design-for-test technique to reduce test volume including a clock gate controller
Grant 8,412,994 - Devta-Prasanna April 2, 2
2013-04-02
Method for generating test patterns for small delay defects
Grant 8,352,818 - Goel , et al. January 8, 2
2013-01-08
Design-for-test Technique To Reduce Test Volume Including A Clock Gate Controller
App 20120072797 - Devta-Prasanna; Narendra B.
2012-03-22
Test circuit and method for testing of infant mortality related defects
Grant 8,140,923 - Goel , et al. March 20, 2
2012-03-20
Method And An Apparatus For Evaluating Small Delay Defect Coverage Of A Test Pattern Set On An Ic
App 20100262394 - Devta-Prasanna; Narendra B. ;   et al.
2010-10-14
Test Circuit And Method For Testing Of Infant Mortality Related Defects
App 20100262876 - Goel; Sandeep Kumar ;   et al.
2010-10-14
Method For Generating Test Patterns For Small Delay Defects
App 20100153795 - Goel; Sandeep Kumar ;   et al.
2010-06-17

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