Dettmann; Wolfgang

Patent Applications and Registrations

Patent applications and USPTO patent grants for Dettmann; Wolfgang.The latest application filed is for "300 mhz to 3 thz electromagnetic wave sensor for determining an interstitial fluid parameter in vivo".

Company Profile

1.6.6

Dettmann; Wolfgang - Schliersee DE
Dettmann; Wolfgang - Munchen DE
Dettmann; Wolfgang - Munich DE
Dettmann, Wolfgang - Muenchen DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
300 MHz to 3 THz electromagnetic wave sensor for determining an interstitial fluid parameter in vivo Grant 10,856,767 - Dettmann , et al. December 8, 2	2020-12-08
Communication arrangement Grant 9,838,086 - Dettmann , et al. December 5, 2	2017-12-05
300 MHz to 3 THz Electromagnetic Wave Sensor for Determining an Interstitial Fluid Parameter in Vivo App 20170181658 - Dettmann; Wolfgang ; et al.	2017-06-29
Communication Arrangement App 20170104513 - DETTMANN; Wolfgang ; et al.	2017-04-13
Set of at least two masks for the projection of structure patterns Grant 7,393,613 - Dettmann , et al. July 1, 2	2008-07-01
Set of masks including a first mask and a second trimming mask with a semitransparent region having a transparency between 20% and 80% to control diffraction effects and obtain maximum depth of focus for the projection of structure patterns onto a semiconductor wafer Grant 7,393,614 - Kohle , et al. July 1, 2	2008-07-01
Method for inspection of periodic grating structures on lithography masks Grant 7,262,850 - Dettmann , et al. August 28, 2	2007-08-28
Mask with programmed defects and method for the fabrication thereof Grant 7,045,254 - Dettmann , et al. May 16, 2	2006-05-16
Set of at least two masks for the projection of structure patterns and method for producing the masks App 20040202943 - Dettmann, Wolfgang ; et al.	2004-10-14
Set of masks for the projection of structure patterns onto a semiconductor wafer App 20040197677 - Kohle, Roderick ; et al.	2004-10-07
Method for inspection of periodic grating structures on lithography masks App 20040165763 - Dettmann, Wolfgang ; et al.	2004-08-26
Mask with programmed defects and method for the fabrication thereof App 20030134206 - Dettmann, Wolfgang ; et al.	2003-07-17

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