| Patent | Date |
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Active Optical Plug To Optically Or Electrically Test A Photonics Package
App 20220196732 - COONS; Todd R. ; et al. | 2022-06-23 |
Stackable Photonics Die With Direct Optical Interconnect
App 20220196915 - COONS; Todd R. ; et al. | 2022-06-23 |
Pierceable Protective Cover For Photonic Connectors
App 20220196924 - WALCZYK; Joe F. ; et al. | 2022-06-23 |
Converged test platforms and processes for class and system testing of integrated circuits
Grant 10,677,845 - Detofsky , et al. | 2020-06-09 |
Stacked Instrument Architecture For Testing And Validation Of Electronic Circuits
App 20190293707 - ACAR; Erkan ; et al. | 2019-09-26 |
Package testing system and method with contact alignment
Grant 10,324,112 - Prabhugoud , et al. | 2019-06-18 |
Increased processing efficiency for optical spectral analyzers
Grant 10,295,406 - Detofsky , et al. | 2019-05-21 |
Systems and methods for wireless device testing
Grant 10,247,773 - Menon , et al. | 2019-04-02 |
Optical Spectral Analyzer
App 20190003888 - Detofsky; Abram M. ; et al. | 2019-01-03 |
Converged Test Platforms And Processes For Class And System Testing Of Integrated Circuits
App 20180252772 - Detofsky; Abram M. ; et al. | 2018-09-06 |
Stacked Instrument Architecture For Testing And Validation Of Electronic Circuits
App 20180188288 - Acar; Erkan ; et al. | 2018-07-05 |
Package Testing System And Method With Contact Alignment
App 20180045759 - Prabhugoud; Mohanraj ; et al. | 2018-02-15 |
Integrated circuit test temperature control mechanism
Grant 9,869,714 - Johnson , et al. January 16, 2 | 2018-01-16 |
Systems And Methods For Wireless Device Testing
App 20180003764 - Menon; Sankaran M. ; et al. | 2018-01-04 |
Integrated circuit testing architecture
Grant 9,506,980 - Detofsky , et al. November 29, 2 | 2016-11-29 |
Integrated Circuit Test Temperature Control Mechanism
App 20160291083 - Johnson; John C. ; et al. | 2016-10-06 |
Integrated circuit test temperature control mechanism
Grant 9,400,291 - Johnson , et al. July 26, 2 | 2016-07-26 |
Micro positioning test socket and methods for active precision alignment and co-planarity feedback
Grant 9,255,945 - Detofsky , et al. February 9, 2 | 2016-02-09 |
Mechanism for facilitating an optical instrumentation testing system employing multiple testing paths
Grant 9,059,803 - Detofsky , et al. June 16, 2 | 2015-06-16 |
Method and apparatus for an optical interconnect system
Grant 8,926,196 - Detofsky , et al. January 6, 2 | 2015-01-06 |
Integrated Circuit Testing Architecture
App 20140266285 - DETOFSKY; Abram M. ; et al. | 2014-09-18 |
Micro Positioning Test Socket And Methods For Active Precision Alignment And Co-planarity Feedback
App 20140218061 - Detofsky; Abram M. ; et al. | 2014-08-07 |
Micro positioning test socket and methods for active precision alignment and co-planarity feedback
Grant 8,710,858 - Detofsky , et al. April 29, 2 | 2014-04-29 |
Mechanism For Faciiltating An Optical Instrumentation Testing System Employing Multiple Testing Paths
App 20140092394 - DETOFSKY; ABRAM M. ; et al. | 2014-04-03 |
Method And Apparatus For An Optical Interconnect System
App 20140093214 - DETOFSKY; Abram M. ; et al. | 2014-04-03 |
Integrated Circuit Test Temperature Control Mechanism
App 20140062513 - Johnson; John C. ; et al. | 2014-03-06 |
Micro Positioning Test Socket And Methods For Active Precision Alignment And Co-planarity Feedback
App 20120074975 - Detofsky; Abram M. ; et al. | 2012-03-29 |
Mapping variations in local temperature and local power supply voltage that are present during operation of an integrated circuit
Grant 7,233,163 - Krishnamoorthy , et al. June 19, 2 | 2007-06-19 |
Mapping variations in local temperature and local power supply voltage that are present during operation of an integrated circuit
App 20060186910 - Krishnamoorthy; Arun ; et al. | 2006-08-24 |
Mapping variations in local temperature and local power supply voltage that are present during operation of an integrated circuit
Grant 7,071,723 - Krishnamoorthy , et al. July 4, 2 | 2006-07-04 |
Mapping variations in local temperature and local power supply voltage that are present during operation of an integrated circuit
App 20050258838 - Krishnamoorthy, Arun ; et al. | 2005-11-24 |
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