Dersch; Uwe

Patent Applications and Registrations

Patent applications and USPTO patent grants for Dersch; Uwe.The latest application filed is for "semiconductor structure including a transistor including a gate electrode region provided in a substrate and method for the formation thereof".

Company Profile

0.5.4

Dersch; Uwe - Moritzburg DE
Dersch; Uwe - Dresden DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and structure for process limiting yield testing Grant 10,147,659 - Dersch , et al. De	2018-12-04
Detection of gate-to-source/drain shorts Grant 10,048,311 - Moll , et al. August 14, 2	2018-08-14
Semiconductor structure including a transistor including a gate electrode region provided in a substrate and method for the formation thereof Grant 9,786,657 - Dersch , et al. October 10, 2	2017-10-10
Semiconductor Structure Including A Transistor Including A Gate Electrode Region Provided In A Substrate And Method For The Formation Thereof App 20170287901 - Dersch; Uwe ; et al.	2017-10-05
Detection Of Gate-to-source/drain Shorts App 20170067955 - Moll; Hans-Peter ; et al.	2017-03-09
Integrated circuits with test structures including bi-directional protection diodes Grant 9,257,353 - Mikalo , et al. February 9, 2	2016-02-09
Mask Blank, Photomask and Method of Manufacturing a Photomask App 20080318139 - Dersch; Uwe ; et al.	2008-12-25
Test pattern and method of evaluating the transfer properties of a test pattern Grant 7,354,684 - Dersch , et al. April 8, 2	2008-04-08
Test pattern and method of evaluating the transfer properties of a test pattern App 20070207394 - Dersch; Uwe ; et al.	2007-09-06

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