Deng; Yuchen
Patent Applications and Registrations
Patent applications and USPTO patent grants for Deng; Yuchen.The latest application filed is for "dual beam microscope system for imaging during sample processing".
- Deng; Yuchen - Eindhoven NL
| Patent | Date |
|---|---|
| Methods and systems for acquiring 3D diffraction data Grant 11,456,149 - Buijsse , et al. September 27, 2 | 2022-09-27 |
| Simultaneous TEM and STEM microscope Grant 11,404,241 - Henstra , et al. August 2, 2 | 2022-08-02 |
| Dual Beam Microscope System For Imaging During Sample Processing App 20210391145 - Deng; Yuchen ; et al. | 2021-12-16 |
| Dual beam microscope system for imaging during sample processing Grant 11,183,364 - Deng , et al. November 23, 2 | 2021-11-23 |
| Simultaneous Tem And Stem Microscope App 20210305012 - Henstra; Alexander ; et al. | 2021-09-30 |
| Electron Diffraction Holography App 20210302333 - Henstra; Alexander ; et al. | 2021-09-30 |
| Dual Beam Bifocal Charged Particle Microscope App 20210305007 - Henstra; Alexander ; et al. | 2021-09-30 |
| Methods And Systems For Acquiring 3d Diffraction Data App 20210305010 - Buijsse; Bart ; et al. | 2021-09-30 |
| Method of imaging a sample using an electron microscope Grant 10,937,625 - Franken , et al. March 2, 2 | 2021-03-02 |
| Systems And Methods For Quantum Computing Based Sample Analysis App 20210049493 - Vivoli; Valentina Caprara ; et al. | 2021-02-18 |
| Method and system for energy resolved chroma imaging Grant 10,923,308 - Deng , et al. February 16, 2 | 2021-02-16 |
| Method Of Imaging A Sample Using An Electron Microscope App 20200168433 - Franken; Erik Michiel ; et al. | 2020-05-28 |
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