Deguchi; Chikahiro

Patent Applications and Registrations

Patent applications and USPTO patent grants for Deguchi; Chikahiro.The latest application filed is for "semiconductor integrated circuit and method of processing in semiconductor integrated circuit".

Company Profile

0.8.9

Deguchi; Chikahiro - Toyohashi JP
Deguchi; Chikahiro - Kawasaki N/A JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Semiconductor integrated circuit and method of processing in semiconductor integrated circuit Grant 9,542,266 - Deguchi , et al. January 10, 2	2017-01-10
Semiconductor Integrated Circuit And Method Of Processing In Semiconductor Integrated Circuit App 20140372837 - Deguchi; Chikahiro ; et al.	2014-12-18
Data receiving circuit, information processing apparatus, a computer readable storage medium, and data receiving method Grant 8,855,242 - Watanabe , et al. October 7, 2	2014-10-07
Relay Device And Relay Method App 20140294015 - SEKINO; Yutaka ; et al.	2014-10-02
Transmission System, Sending Device, Receiving Device, And Transmission Method App 20140192928 - SEKINO; Yutaka ; et al.	2014-07-10
System For Packet Communication And Communication Method App 20140040684 - Tomozaki; Toshihiro ; et al.	2014-02-06
Data Receiving Circuit, Information Processing Apparatus, A Computer Readable Storage Medium, And Data Receiving Method App 20130272454 - WATANABE; Hiroaki ; et al.	2013-10-17
Memory test method and memory test device Grant 8,503,259 - Shibazaki , et al. August 6, 2	2013-08-06
Configuration method and FPGA circuit re-executing configuration based on adjusted configuration data Grant 8,436,644 - Watanabe , et al. May 7, 2	2013-05-07
Test apparatus, test method, and integrated circuit Grant 8,143,901 - Deguchi , et al. March 27, 2	2012-03-27
Configuration method and FPGA circuit App 20110227605 - Watanabe; Hiroaki ; et al.	2011-09-22
Memory test method and memory test device App 20090296505 - Shibazaki; Shogo ; et al.	2009-12-03
Test apparatus, test method, and integrated circuit App 20090300443 - Deguchi; Chikahiro ; et al.	2009-12-03
Encryption circuit Grant 7,158,638 - Okada , et al. January 2, 2	2007-01-02
Encryption circuit App 20030108195 - Okada, Souichi ; et al.	2003-06-12

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