Dee-Noor; Barak
Patent Applications and Registrations
Patent applications and USPTO patent grants for Dee-Noor; Barak.The latest application filed is for "system and method for setting a temperature of an object within a chamber".
- Dee-Noor; Barak - Herzelia IL
| Patent | Date |
|---|---|
| Temperature sensitive location error compensation Grant 10,288,409 - Gronau , et al. | 2019-05-14 |
| Imaging low electron yield regions with a charged beam imager Grant 10,103,005 - Gronau , et al. October 16, 2 | 2018-10-16 |
| System and method for setting a temperature of an object within a chamber Grant 10,074,512 - Yen , et al. September 11, 2 | 2018-09-11 |
| System And Method For Setting A Temperature Of An Object Within A Chamber App 20170011882 - Yen; Chun-Hsiang ; et al. | 2017-01-12 |
| Imaging Low Electron Yield Regions With A Charged Beam Imager App 20170011881 - GRONAU; Yuval ; et al. | 2017-01-12 |
| Temperature Sensitive Location Error Compensation App 20160290786 - GRONAU; Yuval ; et al. | 2016-10-06 |
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