deCecco; Paola

Patent Applications and Registrations

Patent applications and USPTO patent grants for deCecco; Paola.The latest application filed is for "method and system for non-destructive distribution profiling of an element in a film".

Company Profile

0.11.10

deCecco; Paola - Foster City CA US
Dececco; Paola - Redwood City CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and system for non-destructive distribution profiling of an element in a film Grant 9,201,030 - deCecco , et al. December 1, 2	2015-12-01
Method And System For Non-destructive Distribution Profiling Of An Element In A Film App 20150069230 - deCecco; Paola ; et al.	2015-03-12
Method and system for non-destructive distribution profiling of an element in a film Grant 8,610,059 - deCecco , et al. December 17, 2	2013-12-17
Method And System For Non-destructive Distribution Profiling Of An Element In A Film App 20120318974 - deCecco; Paola ; et al.	2012-12-20
Method and system for non-destructive distribution profiling of an element in a film Grant 8,269,167 - deCecco , et al. September 18, 2	2012-09-18
Method And System For Non-destructive Distribution Profiling Of An Element In A Film App 20110144787 - deCecco; Paola ; et al.	2011-06-16
Apparatus and methods for detecting overlay errors using scatterometry Grant 7,933,016 - Mieher , et al. April 26, 2	2011-04-26
Method and system for non-destructive distribution profiling of an element in a film Grant 7,884,321 - deCecco , et al. February 8, 2	2011-02-08
Apparatus And Methods For Detecting Overlay Errors Using Scatterometry App 20100091284 - Mieher; Walter D. ; et al.	2010-04-15
Apparatus and methods for detecting overlay errors using scatterometry Grant 7,663,753 - Mieher , et al. February 16, 2	2010-02-16
Method and system for non-destructive distribution profiling of an element in a film App 20080283743 - deCecco; Paola ; et al.	2008-11-20
Method and system for non-destructive distribution profiling of an element in a film Grant 7,411,188 - deCecco , et al. August 12, 2	2008-08-12
Apparatus and methods for detecting overlay errors using scatterometry Grant 7,379,183 - Mieher , et al. May 27, 2	2008-05-27
Apparatus And Methods For Detecting Overlay Errors Using Scatterometry App 20080094630 - Mieher; Walter D. ; et al.	2008-04-24
Apparatus and methods for detecting overlay errors using scatterometry Grant 7,317,531 - Mieher , et al. January 8, 2	2008-01-08
Method and system for non-destructive distribution profiling of an element in a film App 20070010973 - deCecco; Paola ; et al.	2007-01-11
Apparatus and methods for detecting overlay errors using scatterometry App 20040233442 - Mieher, Walter D. ; et al.	2004-11-25
Apparatus and method for detecting overlay errors using scatterometry App 20040169861 - Mieher, Walter D. ; et al.	2004-09-02

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