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Patent applications and USPTO patent grants for DeBauche; John.The latest application filed is for "testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin rings".
Patent | Date |
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Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin rings Grant 10,928,423 - DeBauche , et al. February 23, 2 | 2021-02-23 |
Testing Apparatus And Method For Microcircuit Testing With Conical Bias Pad And Conductive Test Pin Rings App 20190004093 - DeBauche; John ;   et al. | 2019-01-03 |
Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin rings Grant 10,067,164 - DeBauche , et al. September 4, 2 | 2018-09-04 |
Testing apparatus and method for microcircuit and wafer level IC testing Grant 9,696,347 - DeBauche , et al. July 4, 2 | 2017-07-04 |
Testing Apparatus And Method For Microcircuit Testing With Conical Bias Pad And Conductive Test Pin Rings App 20170059616 - DeBauche; John ;   et al. | 2017-03-02 |
Testing Apparatus And Method For Microcircuit And Wafer Level Ic Testing App 20150015287 - DeBauche; John ;   et al. | 2015-01-15 |
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