loadpatents
Patent applications and USPTO patent grants for DE RUITER; Christiaan Theodoor.The latest application filed is for "method to predict yield of a device manufacturing process".
Patent | Date |
---|---|
Method To Predict Yield Of A Device Manufacturing Process App 20210325788 - YPMA; Alexander ;   et al. | 2021-10-21 |
Method to predict yield of a device manufacturing process Grant 11,086,229 - Ypma , et al. August 10, 2 | 2021-08-10 |
Method for determining an optimized set of measurement locations for measurement of a parameter of a lithographic process, metrology system and computer program products for implementing such methods Grant 10,816,907 - Ten Berge , et al. October 27, 2 | 2020-10-27 |
Method For Determining An Optimized Set Of Measurement Locations For Measurement Of A Parameter Of A Lithographic Process, Metro App 20190258178 - TEN BERGE; Peter ;   et al. | 2019-08-22 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.