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name:-0.0036120414733887
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De La Fuente Valentin; Maria Isabel Patent Filings

De La Fuente Valentin; Maria Isabel

Patent Applications and Registrations

Patent applications and USPTO patent grants for De La Fuente Valentin; Maria Isabel.The latest application filed is for "method and apparatus to determine a patterning process parameter".

Company Profile
4.2.6
  • De La Fuente Valentin; Maria Isabel - Eindhoven NL
  • De La Fuente Valentin; Maria Isabel - Veldhoven NL
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method And Apparatus To Determine A Patterning Process Parameter
App 20220066330 - TSIATMAS; Anagnostis ;   et al.
2022-03-03
Method and apparatus to determine a patterning process parameter
Grant 11,143,972 - Tsiatmas , et al. October 12, 2
2021-10-12
Method Of Determining Information About A Patterning Process, Method Of Reducing Error In Measurement Data, Method Of Calibrating A Metrology Process, Method Of Selecting Metrology Targets
App 20210191280 - Medvedyeva; Mariya Vyacheslavivna ;   et al.
2021-06-24
Method And Apparatus To Determine A Patterning Process Parameter
App 20210035871 - VAN LEEST; Adriaan Johan ;   et al.
2021-02-04
Method and apparatus to determine a patterning process parameter
Grant 10,811,323 - Van Leest , et al. October 20, 2
2020-10-20
Method Of Processing Data, Method Of Obtaining Calibration Data
App 20190204180 - MEDVEDYEVA; Mariya Vyacheslavivna ;   et al.
2019-07-04
Method And Apparatus To Determine A Patterning Process Parameter
App 20190155173 - Tsiatmas; Anagnostis ;   et al.
2019-05-23
Method And Apparatus To Determine A Patterning Process Parameter
App 20170255112 - VAN LEEST; Adriaan Johan ;   et al.
2017-09-07

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