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name:-0.0075039863586426
name:-0.015775918960571
name:-0.00046896934509277
De Jonge; Lieven Patent Filings

De Jonge; Lieven

Patent Applications and Registrations

Patent applications and USPTO patent grants for De Jonge; Lieven.The latest application filed is for "method for the automatic simultaneous synchronization, calibration and qualification of a non-contact probe".

Company Profile
0.5.5
  • De Jonge; Lieven - Overijse BE
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method, device and computer program for evaluating an object using a virtual representation of said object
Grant 7,672,810 - Van Coppenolle , et al. March 2, 2
2010-03-02
Optical probe for scanning the features of an object and methods thereof
Grant 7,428,061 - Coppenolle , et al. September 23, 2
2008-09-23
Method for the automatic simultaneous synchronization, calibration and qualification of a non-contact probe
Grant 7,299,145 - De Jonge , et al. November 20, 2
2007-11-20
Method for the automatic simultaneous synchronization, calibration and qualification of a non-contact probe
App 20070043526 - De Jonge; Lieven ;   et al.
2007-02-22
Method, device and computer program for evaluating an object using a virtual representa- tion of said object
App 20070032901 - Van Coppenolle; Bart ;   et al.
2007-02-08
Optical probe for scanning the features of an object and methods thereof
App 20060215176 - Van Coppenolle; Bart ;   et al.
2006-09-28
Optical probe for scanning the features of an object and methods therefor
Grant 7,009,717 - Van Coppenolle , et al. March 7, 2
2006-03-07
Method for the automatic calibration-only, or calibration and qualification simultaneously of a non-contact probe
Grant 6,944,564 - De Jonge , et al. September 13, 2
2005-09-13
Optical probe for scanning the features of an object and methods therefor
App 20040130729 - Van Coppenolle, Bart ;   et al.
2004-07-08
Method for the automatic calibration-only, or calibration and qualification simultaneously of a non-contact probe
App 20040021876 - De Jonge, Lieven ;   et al.
2004-02-05

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