Patent | Date |
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Semiconductor Device Having Bucket-shaped Under-bump Metallizaton And Method Of Forming Same App 20150187715 - Hart; Michael J. ;   et al. | 2015-07-02 |
Memory array and method of implementing a memory array Grant 8,149,612 - de Jong April 3, 2 | 2012-04-03 |
Electrically programmable diffusion fuse Grant 8,102,019 - Tumakha , et al. January 24, 2 | 2012-01-24 |
Semiconductor Device Having Bucket-shaped Under-bump Metallization And Method Of Forming Same App 20110210443 - Hart; Michael J. ;   et al. | 2011-09-01 |
Method for fabrication of a semiconductor device and structure Grant 7,964,916 - Or-Bach , et al. June 21, 2 | 2011-06-21 |
Memory array and method of implementing a memory array Grant 7,948,791 - de Jong May 24, 2 | 2011-05-24 |
Memory cell with single-event-upset tolerance Grant 7,638,822 - de Jong , et al. December 29, 2 | 2009-12-29 |
Interleaved memory cell with single-event-upset tolerance Grant 7,515,452 - de Jong , et al. April 7, 2 | 2009-04-07 |
Single event upset in SRAM cells in FPGAs with high resistivity gate structures Grant 7,452,765 - Voogel , et al. November 18, 2 | 2008-11-18 |
Method and apparatus for compensating for process variations Grant 7,453,311 - Hart , et al. November 18, 2 | 2008-11-18 |
Circuit for and method of detecting a defect in a component formed in a substrate of an integrated circuit Grant 7,429,867 - de Jong September 30, 2 | 2008-09-30 |
Test circuit and method of use thereof for the manufacture of integrated circuits Grant 7,312,625 - Paak , et al. December 25, 2 | 2007-12-25 |
Single event upset tolerant memory cell layout Grant 7,139,190 - de Jong November 21, 2 | 2006-11-21 |
Methods of implementing phase shift mask compliant static memory cell circuits Grant 7,109,751 - de Jong September 19, 2 | 2006-09-19 |
Static memory cell circuit with single bit line and set/reset write function Grant 7,053,652 - de Jong May 30, 2 | 2006-05-30 |
Electrical fuse for integrated circuits Grant 7,002,219 - de Jong , et al. February 21, 2 | 2006-02-21 |
Single event upset in SRAM cells in FPGAs with high resistivity gate structures Grant 6,982,451 - Voogel , et al. January 3, 2 | 2006-01-03 |
Structures and methods for determining the effects of high stress currents on conducting layers and contacts in integrated circuits Grant 6,867,580 - de Jong , et al. March 15, 2 | 2005-03-15 |
Method of generating an IC mask using a reduced database Grant 6,868,537 - Ho , et al. March 15, 2 | 2005-03-15 |
Structures and methods for determining the effects of high stress currents on conducting layers and contacts in integrated circuits Grant 6,842,019 - de Jong , et al. January 11, 2 | 2005-01-11 |
Ballast resistor with reduced area for ESD protection Grant 6,740,936 - Gitlin , et al. May 25, 2 | 2004-05-25 |
Structures and methods for determining the effects of high stress currents on conducting layers and contacts in integrated circuits Grant 6,727,710 - de Jong , et al. April 27, 2 | 2004-04-27 |
Transistor manufacturing process using three-step base doping Grant 5,006,476 - De Jong , et al. April 9, 1 | 1991-04-09 |