De Jong; Franciscus Gerardus Maria
Patent Applications and Registrations
Patent applications and USPTO patent grants for De Jong; Franciscus Gerardus Maria.The latest application filed is for "high sensitivity magnetic built-in current sensor".
- De Jong; Franciscus Gerardus Maria - Eindhoven NL
| Patent | Date |
|---|---|
| High sensitivity magnetic built-in current sensor Grant 7,619,431 - De Wilde , et al. November 17, 2 | 2009-11-17 |
| Integrated circuit with embedded identification code Grant 7,506,227 - Van De Logt , et al. March 17, 2 | 2009-03-17 |
| Boundary scan circuit with integrated sensor for sensing physical operating parameters Grant 7,380,186 - Schuttert , et al. May 27, 2 | 2008-05-27 |
| Electronic circuit with test unit Grant 7,199,573 - Van De Logt , et al. April 3, 2 | 2007-04-03 |
| High sensitivity magnetic built-in current sensor App 20070063690 - De Wilde; Johannes ; et al. | 2007-03-22 |
| Integrated circuit with embedded identification code App 20060152395 - Van De Logt; Leon Maria Albertus ; et al. | 2006-07-13 |
| Electronic circuit with test unit App 20060061376 - Van De Logt; Leon Maria Albertus ; et al. | 2006-03-23 |
| Electronic circuit and method for testing Grant 6,883,129 - Biewenga , et al. April 19, 2 | 2005-04-19 |
| Integrated circuit with power supply test interface Grant 6,812,690 - De Jong , et al. November 2, 2 | 2004-11-02 |
| Test circuit and test method for protecting an IC against damage from activation of too many current drawing circuits at one time Grant 6,765,403 - De Jong , et al. July 20, 2 | 2004-07-20 |
| Integrated circuit with test interface Grant 6,664,798 - De Jong , et al. December 16, 2 | 2003-12-16 |
| Electronic circuit and method for testing App 20030051198 - Biewenga, Alexander Sebastian ; et al. | 2003-03-13 |
| Integrated circuit with power supply test interface App 20020153876 - De Jong, Franciscus Gerardus Maria ; et al. | 2002-10-24 |
| Test circuit and test method App 20020149387 - De Jong, Franciscus Gerardus Maria ; et al. | 2002-10-17 |
| Integrated circuit with test interface App 20010015653 - De Jong, Franciscus Gerardus Maria ; et al. | 2001-08-23 |
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