Date; Naoki
Patent Applications and Registrations
Patent applications and USPTO patent grants for Date; Naoki.The latest application filed is for "inspection device using scanning electron microscope".
- Date; Naoki - Tokyo JP
| Patent | Date |
|---|---|
| Testing apparatus using scanning electron microscope Grant 6,953,939 - Abe , et al. October 11, 2 | 2005-10-11 |
| System and method for electron beam irradiation Grant 6,831,278 - Yamamoto , et al. December 14, 2 | 2004-12-14 |
| Inspection device using scanning electron microscope App 20040144928 - Abe, Tetsuo ; et al. | 2004-07-29 |
| Electron beam irradiation apparatus and electron beam irradiating method Grant 6,737,660 - Miura , et al. May 18, 2 | 2004-05-18 |
| System and method for electron beam irradiation Grant 6,734,437 - Norioka , et al. May 11, 2 | 2004-05-11 |
| System and method for electron beam irradiation App 20030178582 - Norioka, Setsuo ; et al. | 2003-09-25 |
| Electron beam irradiation apparatus and electron beam irradiating method App 20030178581 - Miura, Yoshihisa ; et al. | 2003-09-25 |
| System and method for electron beam irradiation App 20030116718 - Yamamoto, Masanobu ; et al. | 2003-06-26 |
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