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DasGupta; Sumit Patent Filings

DasGupta; Sumit

Patent Applications and Registrations

Patent applications and USPTO patent grants for DasGupta; Sumit.The latest application filed is for "complete chip i/o test through low contact testing using enhanced boundary scan".

Company Profile
0.6.0
  • DasGupta; Sumit - Austin TX
  • DasGupta; Sumit - Wappingers Falls NY
  • Dasgupta; Sumit - Beacon NY
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Complete chip I/O test through low contact testing using enhanced boundary scan
Grant 5,787,098 - DasGupta , et al. July 28, 1
1998-07-28
Interrupt mechanism for multiprocessing system having a plurality of interrupt lines in both a global bus and cell buses
Grant 4,736,319 - DasGupta , et al. April 5, 1
1988-04-05
Method of concurrently testing each of a plurality of interconnected integrated circuit chips
Grant 4,509,008 - DasGupta , et al. April 2, 1
1985-04-02
Chip partitioning aid (CPA)-A structure for test pattern generation for large logic networks
Grant 4,503,386 - DasGupta , et al. March 5, 1
1985-03-05
Level sensitive scan design (LSSD) system
Grant 4,293,919 - Dasgupta , et al. October 6, 1
1981-10-06
Data Bus Transmission Line Termination Circuit
Grant 3,832,575 - Dasgupta , et al. August 27, 1
1974-08-27

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