Darbinyan; Karen

Patent Applications and Registrations

Patent applications and USPTO patent grants for Darbinyan; Karen.The latest application filed is for "periodic signal measurement using statistical sampling".

Company Profile

0.11.7

Darbinyan; Karen - Pleasanton CA
Darbinyan; Karen - Fremont CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Trademarks

Patent Activity

Patent	Date
Periodic signal measurement using statistical sampling Grant 9,541,591 - Darbinyan , et al. January 10, 2	2017-01-10
Generation of memory structural model based on memory layout Grant 9,514,258 - Amirkhanyan , et al. December 6, 2	2016-12-06
Memory hard macro partition optimization for testing embedded memories Grant 9,336,342 - Zorian , et al. May 10, 2	2016-05-10
Periodic Signal Measurement Using Statistical Sampling App 20160041212 - Darbinyan; Karen ; et al.	2016-02-11
Generation of Memory Structural Model Based on Memory Layout App 20130346056 - Amirkhanyan; Karen ; et al.	2013-12-26
Memory Hard Macro Partition Optimization For Testing Embedded Memories App 20130080847 - Zorian; Yervant ; et al.	2013-03-28
Architecture, system and method for compressing repair data in an integrated circuit (IC) design Grant 8,295,108 - Darbinyan , et al. October 23, 2	2012-10-23
Architecture, System And Method For Compressing Repair Data In An Integrated Circuit (IC) Design App 20110119531 - Darbinyan; Karen ; et al.	2011-05-19
Architecture, system and method for compressing repair data in an integrated circuit (IC) design Grant 7,898,882 - Darbinyan , et al. March 1, 2	2011-03-01
System and method for verifying IP integrity in system-on-chip (SOC) design Grant 7,673,264 - Darbinyan , et al. March 2, 2	2010-03-02
Methods and apparatuses that reduce the size of a repair data container for repairable memories Grant 7,415,640 - Zorian , et al. August 19, 2	2008-08-19
Architecture, System and Method for Compressing Repair Data in an Integrated Circuit (IC) Design App 20080008015 - Darbinyan; Karen ; et al.	2008-01-10
Method and apparatus for a command based bist for testing memories Grant 7,290,186 - Zorian , et al. October 30, 2	2007-10-30
Apparatus, method, and system having a pin to activate the self-test and repair instructions Grant 7,149,924 - Zorian , et al. December 12, 2	2006-12-12

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