loadpatents
Patent applications and USPTO patent grants for Dang; Trinh Hai.The latest application filed is for "high yield rram cell with optimized film scheme".
Patent | Date |
---|---|
High Yield Rram Cell With Optimized Film Scheme App 20190371999 - Dang; Trinh Hai ;   et al. | 2019-12-05 |
High yield RRAM cell with optimized film scheme Grant 10,388,865 - Dang , et al. A | 2019-08-20 |
High K scheme to improve retention performance of resistive random access memory (RRAM) Grant 10,193,065 - Dang , et al. Ja | 2019-01-29 |
RRAM cell bottom electrode formation Grant 10,170,699 - Dang , et al. J | 2019-01-01 |
High Yield Rram Cell With Optimized Film Scheme App 20180138402 - Dang; Trinh Hai ;   et al. | 2018-05-17 |
High yield RRAM cell with optimized film scheme Grant 9,876,167 - Dang , et al. January 23, 2 | 2018-01-23 |
Rram Cell Bottom Electrode Formation App 20170162787 - Dang; Trinh Hai ;   et al. | 2017-06-08 |
RRAM cell bottom electrode formation Grant 9,577,191 - Dang , et al. February 21, 2 | 2017-02-21 |
Oxide film scheme for RRAM structure Grant 9,431,609 - Dang , et al. August 30, 2 | 2016-08-30 |
High K Scheme to Improve Retention Performance of Resistive Random Access Memory (RRAM) App 20160064664 - Dang; Trinh Hai ;   et al. | 2016-03-03 |
Oxide Film Scheme For Rram Structure App 20160049584 - Dang; Trinh Hai ;   et al. | 2016-02-18 |
Rram Cell Bottom Electrode Formation App 20150287918 - Dang; Trinh Hai ;   et al. | 2015-10-08 |
High Yield Rram Cell With Optimized Film Scheme App 20150287917 - Dang; Trinh Hai ;   et al. | 2015-10-08 |
Crystalline layer for passivation of III-N surface Grant 9,130,026 - Chiu , et al. September 8, 2 | 2015-09-08 |
Crystalline Layer for Passivation of III-N Surface App 20150060873 - Chiu; Han-Chin ;   et al. | 2015-03-05 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.