Daneshpanah; Mohammad Mehdi
Patent Applications and Registrations
Patent applications and USPTO patent grants for Daneshpanah; Mohammad Mehdi.The latest application filed is for "apparatus and methods for inspecting reticles".
- Daneshpanah; Mohammad Mehdi - Foster City CA
- DaneshPanah; Mohammad Mehdi - Latham NY
| Patent | Date |
|---|---|
| System and method for switching between an EUV pellicle and an optical pellicle Grant 11,156,927 - Daneshpanah , et al. October 26, 2 | 2021-10-26 |
| Apparatus and methods for inspecting reticles Grant 10,395,361 - Sezginer , et al. A | 2019-08-27 |
| Apparatus And Methods For Inspecting Reticles App 20180082415 - Sezginer; Abdurrahman ; et al. | 2018-03-22 |
| Model-based registration and critical dimension metrology Grant 9,311,700 - Daneshpanah , et al. April 12, 2 | 2016-04-12 |
| System and method for depth from defocus imaging Grant 8,737,756 - DaneshPanah , et al. May 27, 2 | 2014-05-27 |
| Model-Based Registration and Critical Dimension Metrology App 20140086475 - Daneshpanah; Mohammad Mehdi ; et al. | 2014-03-27 |
| System And Method For Depth From Defocus Imaging App 20130141538 - DaneshPanah; Mohammad Mehdi ; et al. | 2013-06-06 |
| System and method for depth from defocus imaging Grant 8,340,456 - DaneshPanah , et al. December 25, 2 | 2012-12-25 |
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