Daio; Kinya
Patent Applications and Registrations
Patent applications and USPTO patent grants for Daio; Kinya.The latest application filed is for "semiconductor device, and design method, design tool, and fault detection method of semiconductor device".
- Daio; Kinya - Kyoto JP
| Patent | Date |
|---|---|
| Semiconductor Device, And Design Method, Design Tool, And Fault Detection Method Of Semiconductor Device App 20110307752 - Fujil; Naohiro ; et al. | 2011-12-15 |
| Semiconductor device Grant 7,925,944 - Hirose , et al. April 12, 2 | 2011-04-12 |
| Semiconductor device Grant 7,777,512 - Hirose , et al. August 17, 2 | 2010-08-17 |
| Semiconductor Device App 20090161813 - Hirose; Masaya ; et al. | 2009-06-25 |
| Semiconductor device Grant 7,498,967 - Hirose , et al. March 3, 2 | 2009-03-03 |
| Semiconductor device including A/D converter Grant 7,479,908 - Hirose , et al. January 20, 2 | 2009-01-20 |
| Semiconductor Device App 20080309378 - Hirose; Masaya ; et al. | 2008-12-18 |
| Semiconductor device having an A/D conversion circuit Grant 7,456,763 - Hirose , et al. November 25, 2 | 2008-11-25 |
| Power switching circuit Grant 7,423,472 - Hirose , et al. September 9, 2 | 2008-09-09 |
| Semiconductor device including A/D converter App 20080007439 - Hirose; Masaya ; et al. | 2008-01-10 |
| Semiconductor device App 20080007440 - Hirose; Masaya ; et al. | 2008-01-10 |
| Semiconductor device App 20070164890 - Hirose; Masaya ; et al. | 2007-07-19 |
| Power switching circuit App 20060214722 - Hirose; Masaya ; et al. | 2006-09-28 |
| Method of inspecting actual speed of semiconductor integrated circuit App 20060001434 - Hiramatsu; Takashi ; et al. | 2006-01-05 |
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