Da Costa Assafrao; Alberto

Patent Applications and Registrations

Patent applications and USPTO patent grants for Da Costa Assafrao; Alberto.The latest application filed is for "method of measuring a structure, inspection apparatus, lithographic system and device manufacturing method".

Company Profile

10.6.7

Da Costa Assafrao; Alberto - Veldhoven NL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method of measuring a structure, inspection apparatus, lithographic system and device manufacturing method Grant 11,022,892 - Warnaar , et al. June 1, 2	2021-06-01
Metrology method, apparatus, and computer program to determine a representative sensitivity coefficient Grant 11,009,345 - Da Costa Assafrao , et al. May 18, 2	2021-05-18
Metrology method and apparatus, computer program and lithographic system Grant 10,705,437 - Javaheri , et al.	2020-07-07
Method of Measuring a Structure, Inspection Apparatus, Lithographic System and Device Manufacturing Method App 20200064744 - WARNAAR; Patrick ; et al.	2020-02-27
Metrology method and apparatus and associated computer product Grant 10,551,750 - Urbanczyk , et al. Fe	2020-02-04
Metrology Method, Apparatus And Computer Program App 20190368867 - DA COSTA ASSAFRAO; Alberto ; et al.	2019-12-05
Method of measuring a structure, inspection apparatus, lithographic system and device manufacturing method Grant 10,466,594 - Warnaar , et al. No	2019-11-05
Metrology Method and Apparatus and Associated Computer Product App 20190250520 - URBANCZYK; Adam Jan ; et al.	2019-08-15
Metrology method and apparatus and associated computer product Grant 10,310,388 - Urbanczyk , et al.	2019-06-04
Metrology Method and Apparatus, Computer Program and Lithographic System App 20190107785 - JAVAHERI; Narjes ; et al.	2019-04-11
Methods And Apparatus For Monitoring A Manufacturing Process, Inspection Apparatus, Lithographic System, Device Manufacturing Method App 20190072496 - Barbu; Ioana Sorina ; et al.	2019-03-07
Metrology Method and Apparatus and Associated Computer Product App 20180217508 - URBANCZYK; Adam ; et al.	2018-08-02
Method of Measuring a Structure, Inspection Apparatus, Lithographic System and Device Manufacturing Method App 20170248852 - WARNAAR; Patrick ; et al.	2017-08-31

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