loadpatents
name:-0.02045202255249
name:-0.044523000717163
name:-0.016109943389893
Czysz; Dariusz Patent Filings

Czysz; Dariusz

Patent Applications and Registrations

Patent applications and USPTO patent grants for Czysz; Dariusz.The latest application filed is for "selective per-cycle masking of scan chains for system level test".

Company Profile
1.15.14
  • Czysz; Dariusz - Wielkopolski PL
  • Czysz; Dariusz - Poznan N/A PL
  • Czysz; Dariusz - Ostrow Wielkopolski PL
  • CZYSZ; DARIUSZ - US
  • Czysz; Dariusz -
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Selective Per-cycle Masking Of Scan Chains For System Level Test
App 20180143249 - Rajski; Janusz ;   et al.
2018-05-24
Selective per-cycle masking of scan chains for system level test
Grant 9,874,606 - Rajski , et al. January 23, 2
2018-01-23
Selective Per-cycle Masking Of Scan Chains For System Level Test
App 20170052227 - Rajski; Janusz ;   et al.
2017-02-23
Selective per-cycle masking of scan chains for system level test
Grant 9,377,508 - Rajski , et al. June 28, 2
2016-06-28
Low power compression of incompatible test cubes
Grant 8,832,512 - Czysz , et al. September 9, 2
2014-09-09
Selective Per-cycle Masking Of Scan Chains For System Level Test
App 20140229779 - Rajski; Janusz ;   et al.
2014-08-14
Selective per-cycle masking of scan chains for system level test
Grant 8,726,113 - Rajski , et al. May 13, 2
2014-05-13
Compression based on deterministic vector clustering of incompatible test cubes
Grant 8,347,159 - Mrugalski , et al. January 1, 2
2013-01-01
Decompressors for low power decompression of test patterns
Grant 8,301,945 - Rajski , et al. October 30, 2
2012-10-30
Low power scan testing techniques and apparatus
Grant 8,290,738 - Lin , et al. October 16, 2
2012-10-16
Selective Per-cycle Masking Of Scan Chains For System Level Test
App 20120210181 - Rajski; Janusz ;   et al.
2012-08-16
Selective per-cycle masking of scan chains for system level test
Grant 8,166,359 - Rajski , et al. April 24, 2
2012-04-24
Decompressors For Low Power Decompression Of Test Patterns
App 20110320999 - Rajski; Janusz ;   et al.
2011-12-29
Low power decompression of test cubes
Grant 8,046,653 - Rajski , et al. October 25, 2
2011-10-25
Low Power Compression Of Incompatible Test Cubes
App 20110231721 - CZYSZ; DARIUSZ ;   et al.
2011-09-22
Decompressors for low power decompression of test patterns
Grant 8,015,461 - Rajski , et al. September 6, 2
2011-09-06
Low Power Scan Testing Techniques And Apparatus
App 20110166818 - Lin; Xijiang ;   et al.
2011-07-07
Low power scan testing techniques and apparatus
Grant 7,925,465 - Lin , et al. April 12, 2
2011-04-12
Low Power Decompression Of Test Cubes
App 20100306609 - Rajski; Janusz ;   et al.
2010-12-02
Low power decompression of test cubes
Grant 7,797,603 - Rajski , et al. September 14, 2
2010-09-14
Compression Based On Deterministic Vector Clustering Of Incompatible Test Cubes
App 20100229060 - MRUGALSKI; GRZEGORZ ;   et al.
2010-09-09
Decompressors For Low Power Decompression Of Test Patterns
App 20100138708 - Rajski; Janusz ;   et al.
2010-06-03
Decompressors for low power decompression of test patterns
Grant 7,647,540 - Rajski , et al. January 12, 2
2010-01-12
Low power scan testing techniques and apparatus
App 20080195346 - Lin; Xijiang ;   et al.
2008-08-14
Decompressors for low power decompression of test patterns
App 20080052578 - Rajski; Janusz ;   et al.
2008-02-28
Low power decompression of test cubes
App 20080052586 - Rajski; Janusz ;   et al.
2008-02-28

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