Czerkas; Slawomir

Patent Applications and Registrations

Patent applications and USPTO patent grants for Czerkas; Slawomir.The latest application filed is for "method and computer program product for controlling the positioning of patterns on a substrate in a manufacturing process".

Company Profile

1.5.7

Czerkas; Slawomir - Weilburg DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and computer program product for controlling the positioning of patterns on a substrate in a manufacturing process Grant 10,303,153 - Czerkas , et al.	2019-05-28
Method and Computer Program Product for Controlling the Positioning of Patterns on a Substrate in a Manufacturing Process App 20180120807 - Czerkas; Slawomir ; et al.	2018-05-03
Method for measuring positions of structures on a mask and thereby determining mask manufacturing errors Grant 9,424,636 - Laske , et al. August 23, 2	2016-08-23
Method For Measuring Positions Of Structures On A Mask And Thereby Determining Mask Manufacturing Errors App 20150248756 - LASKE; Frank ; et al.	2015-09-03
Method for determining the systematic error in the measurement of positions of edges of structures on a substrate resulting from the substrate topology Grant 8,149,383 - Czerkas April 3, 2	2012-04-03
Coordinate measuring machine and method for calibrating the coordinate measuring machine Grant 8,115,808 - Fricke , et al. February 14, 2	2012-02-14
Metrology system and method for monitoring and correcting system generated errors App 20100302555 - Boesser; Hans-Artur ; et al.	2010-12-02
Method for correcting measured values resulting from the bending of a substrate Grant 7,826,068 - Czerkas November 2, 2	2010-11-02
Coordinate Measuring Machine With Temperature Adapting Station App 20090153875 - Czerkas; Slawomir	2009-06-18
Method for determining the systematic error in the measurement of positions of edges of structures on a substrate resulting from the substrate topology App 20090033894 - Czerkas; Slawomir	2009-02-05
Method for Correcting Measured Values Resulting from the Bending of a Substrate App 20090030639 - Czerkas; Slawomir	2009-01-29
Coordinate measuring machine and method for calibrating the coordinate measuring machine App 20090002486 - Fricke; Wolfgang ; et al.	2009-01-01

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