Cuthbert; David R.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Cuthbert; David R..The latest application filed is for "cmos amplifiers with frequency compensating capacitors".

Company Profile

0.24.23

Cuthbert; David R. - Meridian ID

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
CMOS amplifiers with frequency compensating capacitors Grant 7,705,677 - Forbes , et al. April 27, 2	2010-04-27
Time delay oscillator for integrated circuits Grant 7,629,858 - Forbes , et al. December 8, 2	2009-12-08
Technique to improve the gain and signal to noise ratio in CMOS switched capacitor amplifiers Grant 7,498,875 - Forbes , et al. March 3, 2	2009-03-03
Cmos Amplifiers With Frequency Compensating Capacitors App 20080297249 - Forbes; Leonard ; et al.	2008-12-04
Sample and hold memory sense amplifier Grant 7,453,751 - Forbes , et al. November 18, 2	2008-11-18
CMOS amplifiers with frequency compensating capacitors Grant 7,417,505 - Forbes , et al. August 26, 2	2008-08-26
CMOS amplifiers with frequency compensating capacitors Grant 7,339,431 - Forbes , et al. March 4, 2	2008-03-04
Technique to improve the gain and signal to noise ratio in CMOS switched capacitor amplifiers Grant 7,339,423 - Forbes , et al. March 4, 2	2008-03-04
Time delay oscillator for integrated circuits App 20080007359 - Forbes; Leonard ; et al.	2008-01-10
Technique To Improve The Gain And Signal To Noise Ratio In Cmos Switched Capacitor Amplifiers App 20070290741 - Forbes; Leonard ; et al.	2007-12-20
Time delay oscillator for integrated circuits Grant 7,295,081 - Forbes , et al. November 13, 2	2007-11-13
Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer Grant 7,294,790 - Van Horn , et al. November 13, 2	2007-11-13
Integrated circuit characterization printed circuit board, test equipment including same, method of fabrication thereof and method of characterizing an integrated circuit device Grant 7,271,581 - Casey , et al. September 18, 2	2007-09-18
Technique to improve the gain and signal to noise ratio in CMOS switched capacitor amplifiers App 20070182482 - Forbes; Leonard ; et al.	2007-08-09
Methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer Grant 7,239,152 - Van Horn , et al. July 3, 2	2007-07-03
Sample and hold memory sense amplifier Grant 7,236,415 - Forbes , et al. June 26, 2	2007-06-26
CMOS amplifiers with frequency compensating capacitors App 20070139115 - Forbes; Leonard ; et al.	2007-06-21
Technique to improve the gain and signal to noise ratio in CMOS switched capacitor amplifiers Grant 7,230,479 - Forbes , et al. June 12, 2	2007-06-12
Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer Grant 7,212,013 - Van Horn , et al. May 1, 2	2007-05-01
Methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer Grant 7,208,959 - Van Horn , et al. April 24, 2	2007-04-24
Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer Grant 7,208,935 - Van Horn , et al. April 24, 2	2007-04-24
CMOS amplifiers with frequency compensating capacitors Grant 7,202,739 - Forbes , et al. April 10, 2	2007-04-10
Apparatus and methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer Grant 7,199,593 - Van Horn , et al. April 3, 2	2007-04-03
CMOS amplifiers with frequency compensating capacitors Grant 7,180,370 - Forbes , et al. February 20, 2	2007-02-20
Technique to improve the gain and signal to noise ratio in CMOS switched capacitor amplifiers App 20070030059 - Forbes; Leonard ; et al.	2007-02-08
CMOS amplifiers with frequency compensating capacitors App 20060291312 - Forbes; Leonard ; et al.	2006-12-28
Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer Grant 7,145,323 - Van Horn , et al. December 5, 2	2006-12-05
CMOS amplifiers with frequency compensating capacitors App 20060261896 - Forbes; Leonard ; et al.	2006-11-23
Sample and hold memory sense amplifier App 20060250871 - Forbes; Leonard ; et al.	2006-11-09
Integrated circuit characterization printed circuit board Grant 7,119,563 - Casey , et al. October 10, 2	2006-10-10
CMOS amplifiers with frequency compensating capacitors App 20060044066 - Forbes; Leonard ; et al.	2006-03-02
Sample and hold memory sense amplifier App 20060044907 - Forbes; Leonard ; et al.	2006-03-02
Methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer App 20060043987 - Van Horn; Mark T. ; et al.	2006-03-02
Low profile antenna Grant 6,967,629 - Cuthbert November 22, 2	2005-11-22
Integrated circuit characterization printed circuit board App 20050206400 - Casey, William J. ; et al.	2005-09-22
Low profile antenna App 20050184917 - Cuthbert, David R.	2005-08-25
Integrated circuit characterization printed circuit board, test equipment including same, method of fabrication thereof and method of characterizing an integrated circuit device Grant 6,924,637 - Casey , et al. August 2, 2	2005-08-02
Apparatus and methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer App 20050161256 - Horn, Mark T. Van ; et al.	2005-07-28
Apparatus and methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer App 20050161801 - Van Horn, Mark T. ; et al.	2005-07-28
Integratged circuit characterization printed circuit board, test equipment including same, method of fabrication thereof and method of characterizing an integrated circuit device App 20050024039 - Casey, William J. ; et al.	2005-02-03
Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer App 20050024068 - Van Horn, Mark T. ; et al.	2005-02-03
Apparatus and methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer App 20040231887 - Van Horn, Mark T. ; et al.	2004-11-25
Apparatus for measuring parasitic capacitance and inductance of I/O leads on electrical component using a network analyzer Grant 6,822,438 - Van Horn , et al. November 23, 2	2004-11-23
Integrated circuit characterization printed circuit board, test equipment including same, method of fabrication thereof and method of characterizing an integrated circuit device App 20040196025 - Casey, William J. ; et al.	2004-10-07
Apparatus and methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer App 20030132768 - Van Horn, Mark T. ; et al.	2003-07-17
Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer App 20030128042 - Van Horn, Mark T. ; et al.	2003-07-10
Apparatus and methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer App 20030122565 - Van Horn, Mark T. ; et al.	2003-07-03

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.