Cusson; Brian K.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Cusson; Brian K..The latest application filed is for "method and apparatus for performing metrology dispatching based upon fault detection".

Company Profile

0.14.1

Cusson; Brian K. - Austin TX

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Initiating test runs based on fault detection results Grant 7,581,140 - Pasadyn , et al. August 25, 2	2009-08-25
Determining the health of a desired node in a multi-level system Grant 7,246,290 - Green , et al. July 17, 2	2007-07-17
Determining transmission of error effects for improving parametric performance Grant 7,117,062 - Sonderman , et al. October 3, 2	2006-10-03
Conflict resolution among multiple controllers Grant 7,031,793 - Jenkins , et al. April 18, 2	2006-04-18
Fault detection spanning multiple processes Grant 6,991,945 - Castle , et al. January 31, 2	2006-01-31
Method and apparatus for adaptive sampling based on process covariance Grant 6,985,825 - Good , et al. January 10, 2	2006-01-10
Advanced process control of the manufacture of an oxide-nitride-oxide stack of a memory device, and system for accomplishing same Grant 6,953,697 - Castle , et al. October 11, 2	2005-10-11
Process control based on an estimated process result Grant 6,925,347 - Miller , et al. August 2, 2	2005-08-02
Method and apparatus for performing metrology dispatching based upon fault detection App 20050021272 - Jenkins, Naomi M. ; et al.	2005-01-27
Adjusting a trace data rate based upon a tool state Grant 6,834,211 - Coss, Jr. , et al. December 21, 2	2004-12-21
Method of controlling wafer charging effects due to manufacturing processes Grant 6,800,562 - Cusson , et al. October 5, 2	2004-10-05
Identifying a cause of a fault based on a process controller output Grant 6,778,873 - Wang , et al. August 17, 2	2004-08-17
Adjusting a sampling rate based on state estimation results Grant 6,766,214 - Wang , et al. July 20, 2	2004-07-20
Determination of a process flow based upon fault detection analysis Grant 6,740,534 - Adams, III , et al. May 25, 2	2004-05-25
Wafer fabrication system providing measurement data screening Grant 6,446,022 - Coss, Jr. , et al. September 3, 2	2002-09-03

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