Cui; Jianli

Patent Applications and Registrations

Patent applications and USPTO patent grants for Cui; Jianli.The latest application filed is for "multi-pin dense array resistivity probe".

Company Profile

4.6.5

Cui; Jianli - Shanghai CN

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Resistivity probes with curved portions Grant 11,249,110 - Johnson, III , et al. February 15, 2	2022-02-15
Dynamic determination of metal film thickness from sheet resistance and TCR value Grant 10,663,279 - Liu , et al.	2020-05-26
Dynamic determination of metal film thickness from sheet resistance and TCR value Grant 10,598,477 - Liu , et al.	2020-03-24
Multi-Pin Dense Array Resistivity Probe App 20200072869 - Johnson, III; Walter H. ; et al.	2020-03-05
Resistivity probe having movable needle bodies Grant 10,514,391 - Johnson, III , et al. Dec	2019-12-24
Multi-Pin Dense Array Resistivity Probe App 20180052189 - Johnson, III; Walter H. ; et al.	2018-02-22
Dynamic Determination of Metal Film Thickness from Sheet Resistance and TCR Value App 20170227348 - Liu; Xianghua ; et al.	2017-08-10
Dynamic Determination of Metal Film Thickness from Sheet Resistance and TCR Value App 20170227347 - Liu; Xianghua ; et al.	2017-08-10
System and method for nondestructively measuring concentration and thickness of doped semiconductor layers Grant 8,804,106 - Zhu , et al. August 12, 2	2014-08-12
System And Method For Nondestructively Measuring Concentration And Thickness Of Doped Semiconductor Layers App 20130003050 - Zhu; NanChang ; et al.	2013-01-03

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.