| Patent | Date |
|---|
Using Embedded Time-Varying Code Generator to Provide Secure Access to Embedded Content in an On Chip Access Architecture
App 20220244311 - Johnson; James M. ; et al. | 2022-08-04 |
Using embedded time-varying code generator to provide secure access to embedded content in an on chip access architecture
Grant 11,333,706 - Johnson , et al. May 17, 2 | 2022-05-17 |
Using embedded time-varying code generator to provide secure access to embedded content in an on chip access architecture
Grant 10,690,718 - Johnson , et al. | 2020-06-23 |
Method, System And Apparatus For Security Assurance, Protection, Monitoring And Analysis Of Integrated Circuits And Electronic S
App 20200104485 - Crouch; Alfred L. ; et al. | 2020-04-02 |
Using Embedded Time-Varying Code Generator to Provide Secure Access to Embedded Content in an On Chip Access Architecture
App 20190086472 - Johnson; James M. ; et al. | 2019-03-21 |
Protecting hidden content in integrated circuits
Grant 9,811,690 - Dworak , et al. November 7, 2 | 2017-11-07 |
Using Embedded Time-Varying Code Generator to Provide Secure Access to Embedded Content in an On Chip Access Architecture
App 20170131355 - Johnson; James M. ; et al. | 2017-05-11 |
Protection of proprietary embedded instruments
Grant 9,305,186 - Crouch , et al. April 5, 2 | 2016-04-05 |
Protecting Hidden Content In Integrated Circuits
App 20150349968 - Dworak; Jennifer L. ; et al. | 2015-12-03 |
Protection Of Proprietary Embedded Instruments
App 20150026822 - Crouch; Alfred L. ; et al. | 2015-01-22 |
Protection of proprietary embedded instruments
Grant 8,881,301 - Crouch , et al. November 4, 2 | 2014-11-04 |
Process for improving design-limited yield by localizing potential faults from production test data
Grant 8,615,691 - Dokken , et al. December 24, 2 | 2013-12-24 |
Method for operating a secure semiconductor IP server to support failure analysis
Grant 8,060,851 - Dokken , et al. November 15, 2 | 2011-11-15 |
Methods for analyzing scan chains, and for determining numbers or locations of hold time faults in scan chains
Grant 8,010,856 - Cannon , et al. August 30, 2 | 2011-08-30 |
Protection Of Proprietary Embedded Instruments
App 20110083195 - Crouch; Alfred L. ; et al. | 2011-04-07 |
Locating hold time violations in scan chains by generating patterns on ATE
Grant 7,853,846 - Cannon , et al. December 14, 2 | 2010-12-14 |
Method For Operating A Secure Semiconductor Ip Server To Support Failure Analysis
App 20100031092 - DOKKEN; RICHARD C. ; et al. | 2010-02-04 |
Methods For Analyzing Scan Chains, And For Determining Numbers Or Locations Of Hold Time Faults In Scan Chains
App 20090113263 - Cannon; Stephen A. ; et al. | 2009-04-30 |
Locating Hold Time Violations In Scan Chains By Generating Patterns On Ate
App 20090113265 - Cannon; Stephen A. ; et al. | 2009-04-30 |
Process For Improving Design-limited Yield By Localizing Potential Faults From Production Test Data
App 20080091981 - DOKKEN; RICHARD C. ; et al. | 2008-04-17 |
Method and system for network-on-chip and other integrated circuit architectures
Grant 7,348,796 - Crouch , et al. March 25, 2 | 2008-03-25 |
Method and system for network-on-chip and other integrated circuit architectures
App 20070113123 - Crouch; Alfred L. ; et al. | 2007-05-17 |
Test access mechanism for supporting a configurable built-in self-test circuit and method thereof
Grant 6,701,476 - Pouya , et al. March 2, 2 | 2004-03-02 |
Method and apparatus for testing an integrated circuit
Grant 6,598,192 - McLaurin , et al. July 22, 2 | 2003-07-22 |
Test access mechanism for supporting a configurable built-in self-test circuit and method thereof
App 20020184582 - Pouya, Bahram ; et al. | 2002-12-05 |
Wrapper cell architecture for path delay testing of embedded core microprocessors and method of operation
Grant 5,889,788 - Pressly , et al. March 30, 1 | 1999-03-30 |
Scannable storage cell and method of operation
Grant 5,719,878 - Yu , et al. February 17, 1 | 1998-02-17 |
Method for creating a high speed scan-interconnected set of flip-flop elements in an integrated circuit to enable faster scan-based testing
Grant 5,717,700 - Crouch , et al. February 10, 1 | 1998-02-10 |
Data Processor having a built-in internal self test controller for testing a plurality of memories internal to the data processor
Grant 5,617,531 - Crouch , et al. April 1, 1 | 1997-04-01 |
Serial scan chain architecture for a data processing system and method of operation
Grant 5,592,493 - Crouch , et al. January 7, 1 | 1997-01-07 |
Method and apparatus for testing pin isolation for an integrated circuit in a low power mode of operation
Grant 5,561,614 - Revilla , et al. October 1, 1 | 1996-10-01 |
Method and apparatus for testing a clock stopping/starting function of a low power mode in a data processor
Grant 5,553,236 - Revilla , et al. September 3, 1 | 1996-09-03 |
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