loadpatents
name:-0.02092719078064
name:-0.015326023101807
name:-0.011178970336914
Crippa; Roberto Patent Filings

Crippa; Roberto

Patent Applications and Registrations

Patent applications and USPTO patent grants for Crippa; Roberto.The latest application filed is for "manufacturing method for manufacturing contact probes for probe heads of electronic devices and corresponding contact probe".

Company Profile
13.15.20
  • Crippa; Roberto - Cernusco Lombardone IT
  • CRIPPA; Roberto - Cernusco Lombardone LC IT
  • Crippa; Roberto - Costa Masnaga IT
  • Crippa; Roberto - US
  • Crippa, Roberto - Costa Masnaga Lecco
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Contact probe and relative probe head of an apparatus for testing electronic devices
Grant 11,442,080 - Crippa , et al. September 13, 2
2022-09-13
Contact probe for a testing head for testing high-frequency devices
Grant 11,340,262 - Crippa , et al. May 24, 2
2022-05-24
Probe head for electronic devices and corresponding probe card
App 20220155348 - CRIPPA; Roberto
2022-05-19
Manufacturing Method For Manufacturing Contact Probes For Probe Heads Of Electronic Devices And Corresponding Contact Probe
App 20220155344 - CRIPPA; Roberto
2022-05-19
Interface element for a testing apparatus of electronic devices and corresponding manufacturing method
Grant 11,293,941 - Crippa , et al. April 5, 2
2022-04-05
Contact Probe And Relative Probe Head Of An Apparatus For Testing Electronic Devices
App 20210247422 - CRIPPA; Roberto ;   et al.
2021-08-12
Vertical probe testing head with improved frequency properties
Grant 11,029,337 - Crippa , et al. June 8, 2
2021-06-08
Contact probe and relative probe head of an apparatus for testing electronic devices
Grant 11,016,122 - Crippa , et al. May 25, 2
2021-05-25
Probe card for electronics devices
Grant 10,782,319 - Crippa , et al. Sept
2020-09-22
Contact Probe For A Testing Head For Testing High-frequency Devices
App 20200271692 - CRIPPA; Roberto ;   et al.
2020-08-27
Interface Element For A Testing Apparatus Of Electronic Devices And Corresponding Manufacturing Method
App 20200200795 - CRIPPA; Roberto ;   et al.
2020-06-25
Manufacturing Method Of A Multi-layer For A Probe Card
App 20200072873 - CRIPPA; Roberto ;   et al.
2020-03-05
Testing head comprising vertical probes
Grant 10,551,433 - Crippa , et al. Fe
2020-02-04
Vertical Probe Testing Head With Improved Frequency Properties
App 20190377006 - Crippa; Roberto ;   et al.
2019-12-12
Testing Head With Improved Frequency Property
App 20190377005 - Crippa; Roberto ;   et al.
2019-12-12
Contact Probe And Relative Probe Head Of An Apparatus For Testing Electronic Devices
App 20190293686 - CRIPPA; Roberto ;   et al.
2019-09-26
Manufacturing method of a semi-finished product comprising a plurality of contact probes for a testing head of electronic devices and related semi-finished product
Grant 10,365,299 - Crippa , et al. July 30, 2
2019-07-30
Probe Card For Electronic Devices
App 20190113539 - CRIPPA; Roberto ;   et al.
2019-04-18
Contact probe for a testing head
Grant 10,228,392 - Crippa , et al.
2019-03-12
High-planarity probe card for a testing apparatus for electronic devices
Grant 10,151,775 - Liberini , et al. Dec
2018-12-11
Testing Head Comprising Vertical Probes
App 20180003767 - Crippa; Roberto ;   et al.
2018-01-04
Testing head of electronic devices
Grant 9,829,508 - Felici , et al. November 28, 2
2017-11-28
Manufacturing Method Of A Semi-finished Product Comprising A Plurality Of Contact Probes For A Testing Head Of Electronic Devices And Related Semi-finished Product
App 20170299634 - Crippa; Giuseppe ;   et al.
2017-10-19
Contact Probe For A Testing Head
App 20170269125 - CRIPPA; Roberto ;   et al.
2017-09-21
Contact Probe For A Testing Head And Corresponding Manufacturing Method
App 20170122980 - Crippa; Roberto ;   et al.
2017-05-04
Contact Probe For A Testing Head
App 20170059612 - CRIPPA; Roberto ;   et al.
2017-03-02
High-planarity Probe Card For A Testing Apparatus For Electronic Devices
App 20160377655 - Liberini; Riccardo ;   et al.
2016-12-29
Testing head for a test equipment of electronic devices
Grant 9,429,593 - Crippa August 30, 2
2016-08-30
Testing Head Of Electronic Devices
App 20150309076 - Felici; Stefano ;   et al.
2015-10-29
Testing Head For A Test Equipment Of Electronic Devices
App 20120280703 - Crippa; Roberto
2012-11-08
System for unmating a connector pair
Grant 7,465,175 - Crippa , et al. December 16, 2
2008-12-16
System for unmating a connector pair
App 20070254508 - Crippa; Roberto ;   et al.
2007-11-01
Device for hooking/unhooking LC connectors
Grant 7,004,779 - Oreglio , et al. February 28, 2
2006-02-28
Device for hooking/unhooking LC connectors
App 20040166716 - Oreglio, Maurizio ;   et al.
2004-08-26

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed