COTTAAR; Jeroen

Patent Applications and Registrations

Patent applications and USPTO patent grants for COTTAAR; Jeroen.The latest application filed is for "improvements in metrology targets".

Company Profile

2.4.6

COTTAAR; Jeroen - Eindhoven NL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Improvements In Metrology Targets App 20220260929 - MEHTA; Nikhil ; et al.	2022-08-18
Method and apparatus for configuring spatial dimensions of a beam during a scan Grant 11,366,396 - Slotboom , et al. June 21, 2	2022-06-21
Method of determining a height profile, a measurement system and a computer readable medium Grant 11,137,695 - Donkerbroek , et al. October 5, 2	2021-10-05
Method And Apparatus For Configuring Spatial Dimensions Of A Beam During A Scan App 20210302843 - SLOTBOOM; Daan Maurits ; et al.	2021-09-30
Three-dimensional master equation simulations of charge-carrier transport and recombination in organic semiconductor materials and devices App 20210165944 - Coehoorn; Reinder ; et al.	2021-06-03
Lithographic apparatus and device manufacturing method Grant 10,915,033 - Van Hoof , et al. February 9, 2	2021-02-09
Methods for controlling lithographic apparatus, lithographic apparatus and device manufacturing method Grant 10,845,719 - Queens , et al. November 24, 2	2020-11-24
Lithographic Apparatus And Device Manufacturing Method App 20200326637 - VAN HOOF; Bram ; et al.	2020-10-15
Methods For Controlling Lithographic Apparatus, Lithographic Apparatus And Device Manufacturing Method App 20190384188 - QUEENS; Rene Marinus Gerardus Johan ; et al.	2019-12-19
A Method Of Determining A Height Profile, A Measurement System And A Computer Readable Medium App 20190294060 - DONKERBROEK; Arend Johannes ; et al.	2019-09-26

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