Conchieri; Brian P.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Conchieri; Brian P..The latest application filed is for "test strucutre for monitoring interface delamination".
- Conchieri; Brian P. - Essex VT
- Conchieri; Brian P. - Essex Junction VT
| Patent | Date |
|---|---|
| Test structure for monitoring interface delamination Grant 10,056,306 - Cooney, III , et al. August 21, 2 | 2018-08-21 |
| Test Strucutre For Monitoring Interface Delamination App 20170229358 - Cooney, III; Edward C. ; et al. | 2017-08-10 |
| Part number inhibit control Grant 6,917,841 - Conchieri , et al. July 12, 2 | 2005-07-12 |
| Apparatus and system for eliminating contaminants on a substrate surface Grant 6,855,207 - Conchieri , et al. February 15, 2 | 2005-02-15 |
| Part Number Inhibit Control App 20040122546 - Conchieri, Brian P. ; et al. | 2004-06-24 |
| Treatment to eliminate polysilicon defects induced by metallic contaminants App 20040118810 - Conchieri, Brian P. ; et al. | 2004-06-24 |
| Treatment to eliminate polysilicon defects induced by metallic contaminants Grant 6,715,497 - Conchieri , et al. April 6, 2 | 2004-04-06 |
| Effective channel length control using ion implant feed forward Grant 6,697,697 - Conchieri , et al. February 24, 2 | 2004-02-24 |
| Treatment to eliminate polysilicon defects induced by metallic contaminants App 20030157786 - Conchieri, Brian P. ; et al. | 2003-08-21 |
| Effective channel length control using ion implant feed forward App 20020182757 - Conchieri, Brian P. ; et al. | 2002-12-05 |
| Effective channel length control using ion implant feed forward Grant 6,482,660 - Conchieri , et al. November 19, 2 | 2002-11-19 |
| Effective Channel Length Control Using Ion Implant Feed Forward App 20020132377 - Conchieri, Brian P. ; et al. | 2002-09-19 |
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