Colonna de Lega; Xavier M.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Colonna de Lega; Xavier M..The latest application filed is for "object thickness and surface profile measurements".
- Colonna de Lega; Xavier M. - Middlefield CT
| Patent | Date |
|---|---|
| Low coherence interferometry with scan error correction Grant 8,902,431 - Liesener , et al. December 2, 2 | 2014-12-02 |
| Interferometric methods for metrology of surfaces, films and underresolved structures Grant 8,854,628 - Colonna de Lega , et al. October 7, 2 | 2014-10-07 |
| Object thickness and surface profile measurements Grant 8,698,891 - Turner , et al. April 15, 2 | 2014-04-15 |
| Non-contact surface characterization using modulated illumination Grant 8,649,024 - Colonna de Lega February 11, 2 | 2014-02-11 |
| Object Thickness And Surface Profile Measurements App 20120229621 - Turner; Justin ; et al. | 2012-09-13 |
| Non-contact Surface Characterization Using Modulated Illumination App 20120140243 - Colonna de Lega; Xavier M. | 2012-06-07 |
| Interferometric Methods For Metrology Of Surfaces, Films And Underresolved Structures App 20120069326 - Colonna de Lega; Xavier M. ; et al. | 2012-03-22 |
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