Colonna de Lega; Xavier

Patent Applications and Registrations

Patent applications and USPTO patent grants for Colonna de Lega; Xavier.The latest application filed is for "optical evaluation of lenses and lens molds".

Company Profile

0.11.18

Colonna de Lega; Xavier - Middlefield CT
Colonna De Lega; Xavier - Middletown CT

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Calibration of scanning interferometers Grant 9,958,254 - de Groot , et al. May 1, 2	2018-05-01
Interferometer with real-time fringe-free imaging Grant 9,719,777 - Colonna de Lega , et al. August 1, 2	2017-08-01
Method and system for determining information about a transparent optical element comprising a lens portion and a plane parallel portion Grant 9,658,129 - Colonna de Lega , et al. May 23, 2	2017-05-23
Optical evaluation of lenses and lens molds Grant 9,599,534 - Fay , et al. March 21, 2	2017-03-21
Surface topography interferometer with surface color Grant 9,541,381 - Colonna de Lega January 10, 2	2017-01-10
Calibration Of Scanning Interferometers App 20160047645 - de Groot; Peter J. ; et al.	2016-02-18
Optical Evaluation Of Lenses And Lens Molds App 20160047712 - Colonna de Lega; Xavier ; et al.	2016-02-18
Optical Evaluation Of Lenses And Lens Molds App 20160047711 - Fay; Martin F. ; et al.	2016-02-18
Interferometry for lateral metrology Grant 9,025,162 - Colonna de Lega , et al. May 5, 2	2015-05-05
Surface Topography Interferometer With Surface Color App 20140226150 - Colonna de Lega; Xavier	2014-08-14
Low Coherence Interferometry With Scan Error Correction App 20130155413 - Liesener; Jan ; et al.	2013-06-20
Interferometric Metrology Of Surfaces, Films And Underresolved Structures App 20120224183 - Fay; Martin ; et al.	2012-09-06
Data Interpolation Methods For Metrology Of Surfaces, Films And Underresolved Structures App 20120089365 - Fay; Martin ; et al.	2012-04-12
Interferometric systems and methods featuring spectral analysis of unevenly sampled data Grant 8,120,781 - Liesener , et al. February 21, 2	2012-02-21
Scan error correction in low coherence scanning interferometry Grant 8,004,688 - Davidson , et al. August 23, 2	2011-08-23
Apparatus and method for measuring characteristics of surface features Grant 7,924,435 - Colonna De Lega , et al. April 12, 2	2011-04-12
Interferometer For Determining Overlay Errors App 20110032535 - Liesener; Jan ; et al.	2011-02-10
Scan Error Correction In Low Coherence Scanning Interferometry App 20100128280 - Davidson; Mark ; et al.	2010-05-27
Compound Reference Interferometer App 20100128276 - De Groot; Peter ; et al.	2010-05-27
Interferometry For Lateral Metrology App 20090303493 - Colonna de Lega; Xavier ; et al.	2009-12-10
Interferometer For Overlay Measurements App 20090262362 - de Groot; Peter ; et al.	2009-10-22
Scanning interferometry for thin film thickness and surface measurements Grant 7,468,799 - de Groot , et al. December 23, 2	2008-12-23
Scanning Interferometry For Thin Film Thickness And Surface Measurements App 20080180694 - de Groot; Peter J. ; et al.	2008-07-31
Apparatus And Method For Measuring Characteristics Of Surface Features App 20080174784 - Colonna De Lega; Xavier ; et al.	2008-07-24
Interferometer with multiple modes of operation for determining characteristics of an object surface App 20060158658 - Colonna De Lega; Xavier ; et al.	2006-07-20
Interferometer for determining characteristics of an object surface App 20060158659 - Colonna De Lega; Xavier ; et al.	2006-07-20
Low coherence grazing incidence interferometry systems and methods App 20050057757 - Colonna De Lega, Xavier ; et al.	2005-03-17

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