COHEN; Yoel

Patent Applications and Registrations

Patent applications and USPTO patent grants for COHEN; Yoel.The latest application filed is for "apparatus and methods for calibrating optical measurements".

Company Profile

3.34.33

COHEN; Yoel - Nes Ziona IL
Cohen; Yoel - Ness Ziona N/A IL
Cohen, Yoel - Ramat Gan IL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Apparatus And Methods For Calibrating Optical Measurements App 20220034716 - COHEN; Yoel ; et al.	2022-02-03
System And Method For Performing Tear Film Structure Measurement App 20220007933 - ARIELI; Yoel ; et al.	2022-01-13
System and method for performing tear film structure measurement Grant 11,116,394 - Arieli , et al. September 14, 2	2021-09-14
Apparatus and methods for performing tomography and/or topography measurements on an object Grant 10,612,913 - Arieli , et al.	2020-04-07
Apparatus and method for detecting surface topography Grant 10,456,029 - Arieli , et al. Oc	2019-10-29
Method for analyzing an object Grant 10,415,954 - Arieli , et al. Sept	2019-09-17
System for analyzing optical properties of an object Grant 10,330,462 - Arieli , et al.	2019-06-25
System And Method For Performing Tear Film Structure Measurement App 20190183333 - ARIELI; Yoel ; et al.	2019-06-20
Method for Analyzing an Object App 20190017804 - Arieli; Yoel ; et al.	2019-01-17
Apparatus and Methods for Performing Tomography and/or Topography Measurements on an Object App 20180340770 - Arieli; Yoel ; et al.	2018-11-29
Interferometric ellipsometry and method using conical refraction Grant 10,119,903 - Arieli , et al. November 6, 2	2018-11-06
System For Analyzing Optical Properties Of An Object App 20180299252 - Arieli; Yoel ; et al.	2018-10-18
Interferometric Ellipsometry and Method using Conical Refraction App 20180275047 - Arieli; Yoel ; et al.	2018-09-27
System for tomography and/or topography measurements of a layered objects Grant 10,054,429 - Arieli , et al. August 21, 2	2018-08-21
Method for analyzing an object using a combination of long and short coherence interferometry Grant 10,054,419 - Arieli , et al. August 21, 2	2018-08-21
Interferometric ellipsometry and method using conical refraction Grant 10,024,783 - Arieli , et al. July 17, 2	2018-07-17
System for analyzing optical properties of an object Grant 10,024,650 - Arieli , et al. July 17, 2	2018-07-17
Apparatus and Method for Detecting Surface Topography App 20180070813 - Arieli; Yoel ; et al.	2018-03-15
System and method for performing tear film structure measurement Grant 9,833,139 - Arieli , et al. December 5, 2	2017-12-05
System And Method For Performing Tear Film Structure Measurement App 20170332897 - Arieli; Yoel ; et al.	2017-11-23
System and method for performing tear film structure measurement and evaporation rate measurements Grant 9,757,027 - Arieli , et al. September 12, 2	2017-09-12
System For Analyzing Optical Properties Of An Object App 20170241766 - Arieli; Yoel ; et al.	2017-08-24
System for Tomography and/or Topography Measurements of a Layered Objects App 20170074644 - Arieli; Yoel ; et al.	2017-03-16
Method for Analyzing an Object Using a Combination of Long and Short Coherence Interferometry App 20170038191 - Arieli; Yoel ; et al.	2017-02-09
Interferometric Ellipsometry and Method using Conical Refraction App 20170023464 - Arieli; Yoel ; et al.	2017-01-26
System and Method for Performing Tear Film Structure Measurement and Evaporation Rate Measurements App 20160338585 - Arieli; Yoel ; et al.	2016-11-24
Monitoring apparatus and method particularly useful in photolithographically processing substrates Grant 9,291,911 - Dishon , et al. March 22, 2	2016-03-22
Method and system for use in monitoring properties of patterned structures Grant 8,964,178 - Cohen , et al. February 24, 2	2015-02-24
Monitoring Apparatus And Method Particularly Useful In Photolithographically Processing Substrates App 20140320837 - DISHON; Giora ; et al.	2014-10-30
Monitoring apparatus and method particularly useful in photolithographically processing substrates Grant 8,780,320 - Dishon , et al. July 15, 2	2014-07-15
Method And System For Use In Monitoring Properties Of Patterned Structures App 20140142869 - COHEN; Yoel ; et al.	2014-05-22
Method and system for use in monitoring properties of patterned structures Grant 8,643,842 - Cohen , et al. February 4, 2	2014-02-04
Monitoring Apparatus And Method Particularly Useful In Photolithographically Processing Substrates App 20130293872 - DISHON; Giora ; et al.	2013-11-07
Thin films measurement method and system Grant 8,564,793 - Cohen , et al. October 22, 2	2013-10-22
Monitoring apparatus and method particularly useful in photolithographically processing substrates Grant 8,482,715 - Dishon , et al. July 9, 2	2013-07-09
Method And System For Use In Monitoring Properties Of Patterned Structures App 20130096876 - COHEN; YOEL ; et al.	2013-04-18
Method and system for use in monitoring properties of patterned structures Grant 8,289,515 - Cohen , et al. October 16, 2	2012-10-16
Thin Films Measurement Method And System App 20120044506 - COHEN; Yoel ; et al.	2012-02-23
Thin films measurement method and system Grant 8,040,532 - Cohen , et al. October 18, 2	2011-10-18
Monitoring Apparatus And Method Particularly Useful In Photolithographically Processing Substrates App 20110037957 - Dishon; Giora ; et al.	2011-02-17
Monitoring apparatus and method particularly useful in photolithographically processing substrates Grant 7,821,614 - Dishon , et al. October 26, 2	2010-10-26
Method And System For Use In Monitoring Properties Of Patterned Structures App 20100141948 - Cohen; Yoel ; et al.	2010-06-10
Method And System For Measuring In Patterned Structures App 20100099033 - Cohen; Yoel	2010-04-22
Thin Films measurment method and system App 20100010659 - Cohen; Yoel ; et al.	2010-01-14
Thin films measurement method and system Grant 7,595,896 - Cohen , et al. September 29, 2	2009-09-29
Monitoring Apparatus And Method Particularly Useful In Photolithographically Processing Substrates App 20090231558 - Dishon; Giora ; et al.	2009-09-17
Monitoring apparatus and method particularly useful in photolithographically Grant 7,525,634 - Dishon , et al. April 28, 2	2009-04-28
Thin films measurement method and system App 20080204721 - Cohen; Yoel ; et al.	2008-08-28
Monitoring Apparatus And Method Particularly Useful In Photolithographically App 20080043229 - DISHON; Giora ; et al.	2008-02-21
Thin films measurement method and system Grant 7,327,476 - Cohen , et al. February 5, 2	2008-02-05
Monitoring apparatus and method particularly useful in photolithographically Grant 7,289,190 - Dishon , et al. October 30, 2	2007-10-30
Monitoring apparatus and method particularly useful in photolithographically App 20060193630 - Dishon; Giora ; et al.	2006-08-31
Monitoring apparatus and method particularly useful in photolithographically processing substrates Grant 7,030,957 - Dishon , et al. April 18, 2	2006-04-18
Display aid App 20050183298 - Cohen, Yoel ; et al.	2005-08-25
Monitoring apparatus and method particularly useful in photolithographically processing substrates Grant 6,842,220 - Dishon , et al. January 11, 2	2005-01-11
Monitoring apparatus and method particularly useful in photolithographically processing substrates App 20040191652 - Dishon, Giora ; et al.	2004-09-30
Method and system for optical inspection of a structure formed with a surface relief Grant 6,720,568 - Finarov , et al. April 13, 2	2004-04-13
Process control for micro-lithography Grant 6,704,920 - Brill , et al. March 9, 2	2004-03-09
Thin films measurement method and system App 20040042017 - Cohen, Yoel ; et al.	2004-03-04
Method and system for controlling the photolithography process Grant 6,643,017 - Cohen , et al. November 4, 2	2003-11-04
Method and system for controlling the photolithography process App 20020171828 - Cohen, Yoel ; et al.	2002-11-21
Method and system for controlling the photolithography process Grant 6,424,417 - Cohen , et al. July 23, 2	2002-07-23
Process control for micro-lithography App 20020072003 - Brill, Boaz ; et al.	2002-06-13
Method and system for optical inspection of a structure formed with a surface relief App 20020033450 - Finarov, Moshe ; et al.	2002-03-21
Monitoring apparatus and method particularly useful in photolithographically processing substrates Grant 6,166,801 - Dishon , et al. December 26, 2	2000-12-26

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