Clarysse; Trudo

Patent Applications and Registrations

Patent applications and USPTO patent grants for Clarysse; Trudo.The latest application filed is for "method for determining the active doping concentration of a doped semiconductor region".

Company Profile

0.7.5

Clarysse; Trudo - Leuven BE
Clarysse; Trudo - Antwerp N/A BE
Clarysse; Trudo - Antwerpen BE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method for determining the active doping concentration of a doped semiconductor region Grant 8,717,570 - Bogdanowicz , et al. May 6, 2	2014-05-06
Method For Determining The Active Doping Concentration Of A Doped Semiconductor Region App 20130155409 - BOGDANOWICZ; Janusz ; et al.	2013-06-20
Junction-photovoltage method and apparatus for contactless determination of sheet resistance and leakage current of semiconductor Grant 8,364,428 - Schaus , et al. January 29, 2	2013-01-29
Method and device for the independent extraction of carrier concentration level and electrical junction depth in a semiconductor substrate Grant 8,314,628 - Clarysse , et al. November 20, 2	2012-11-20
Method and device to quantify active carrier profiles in ultra-shallow semiconductor structures Grant 7,751,035 - Clarysse , et al. July 6, 2	2010-07-06
Junction-photovoltage Method And Apparatus For Contactless Determination Of Sheet Resistance And Leakage Current Of Semiconductor App 20100153033 - Schaus; Frederic ; et al.	2010-06-17
Method And Device To Quantify Active Carrier Profiles In Ultra-shallow Semiconductor Structures App 20080224036 - Clarysse; Trudo ; et al.	2008-09-18
Method And Device For The Independent Extraction Of Carrier Concentration Level And Electrical Junction Depth In A Semiconductor Substrate App 20070292976 - Clarysse; Trudo ; et al.	2007-12-20
System and method for measuring properties of a semiconductor substrate in a non-destructive way Grant 7,133,128 - Clarysse , et al. November 7, 2	2006-11-07
System and method for measuring properties of a semiconductor substrate in a non-destructive way App 20040064263 - Clarysse, Trudo ; et al.	2004-04-01
Database and method for measurement correction for cross-sectional carrier profiling techniques Grant 5,995,912 - DeWolf , et al. November 30, 1	1999-11-30

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