Ciplickas; Dennis J.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ciplickas; Dennis J..The latest application filed is for "e-beam inspection apparatus and method of using the same on various integrated circuit chips".

Company Profile

0.13.11

Ciplickas; Dennis J. - San Jose CA
Ciplickas, Dennis J - San Jose CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
E-beam inspection apparatus and method of using the same on various integrated circuit chips Grant 9,793,090 - De , et al. October 17, 2	2017-10-17
E-beam inspection apparatus and method of using the same on various integrated circuit chips Grant 9,496,119 - De , et al. November 15, 2	2016-11-15
E-beam Inspection Apparatus And Method Of Using The Same On Various Integrated Circuit Chips App 20160118217 - De; Indranil ; et al.	2016-04-28
Opportunistic Placement Of Ic Test Strucutres And/or E-beam Target Pads In Areas Otherwise Used For Filler Cells, Tap Cells, Decap Cells, Scribe Lines, And/or Dummy Fill, As Well As Product Ic Chips Containing Same App 20150270181 - De; Indranil ; et al.	2015-09-24
System and method for product yield prediction Grant 7,673,262 - Stine , et al. March 2, 2	2010-03-02
System And Method For Product Yield Prediction App 20080282210 - Stine; Brian E. ; et al.	2008-11-13
Back end of line clone test vehicle Grant 7,395,518 - Ciplickas , et al. July 1, 2	2008-07-01
System and method for product yield prediction Grant 7,373,625 - Stine , et al. May 13, 2	2008-05-13
System and method for product yield prediction Grant 7,356,800 - Stine , et al. April 8, 2	2008-04-08
Test structures and models for estimating the yield impact of dishing and/or voids Grant 7,348,594 - Ciplickas , et al. March 25, 2	2008-03-25
System and method for product yield prediction App 20070118242 - Stine; Brian E. ; et al.	2007-05-24
Test structures for estimating dishing and erosion effects in copper damascene technology Grant 7,197,726 - Ciplickas , et al. March 27, 2	2007-03-27
System and method for product yield prediction Grant 7,174,521 - Stine , et al. February 6, 2	2007-02-06
Zoom in pin nest structure, test vehicle having the structure, and method of fabricating the structure Grant 7,154,115 - Stine , et al. December 26, 2	2006-12-26
System and method for product yield prediction App 20060277506 - Stine; Brian E. ; et al.	2006-12-07
Extraction method of defect density and size distributions Grant 7,024,642 - Hess , et al. April 4, 2	2006-04-04
System and method for product yield prediction App 20050158888 - Stine, Brian E. ; et al.	2005-07-21
System and method for product yield prediction Grant 6,901,564 - Stine , et al. May 31, 2	2005-05-31
Back end of line clone test vehicle App 20050086617 - Ciplickas, Dennis J. ; et al.	2005-04-21
Test structures and models for estimating the yield impact of dishing and/or voids App 20050074908 - Ciplickas, Dennis J. ; et al.	2005-04-07
System and method for product yield prediction using a logic characterization vehicle Grant 6,834,375 - Stine , et al. December 21, 2	2004-12-21
Test structures for estimating dishing and erosion effects in copper damascene technology App 20040232910 - Ciplickas, Dennis J ; et al.	2004-11-25
Extraction method of defect density and size distributions App 20040094762 - Hess, Christopher ; et al.	2004-05-20
System and method for product yield prediction App 20030145292 - Stine, Brian E. ; et al.	2003-07-31

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