CHUNGHWA PRECISION TEST TECH. CO., LTD.
Patent Applications and Registrations
Patent applications and USPTO patent grants for CHUNGHWA PRECISION TEST TECH. CO., LTD..The latest application filed is for "probe card device and dual-arm probe".
Company Profile
45.63.50
- CHUNGHWA PRECISION TEST TECH. CO., LTD. - Taoyuan City TW
- CHUNGHWA PRECISION TEST TECH. CO., LTD. - Taoyuan TW
- CHUNGHWA PRECISION TEST TECH. CO., LTD. - TTaoyuan City TW
- CHUNGHWA PRECISION TEST TECH. CO., LTD. - TAOYUAN COUNTY TW
Patent Activity
| Patent | Date |
|---|---|
| Probe Card Device And Dual-arm Probe App 20220170960 - HSIEH; KAI-CHIEH ; et al. | 2022-06-02 |
| Probe Card Device And Self-aligned Probe App 20220163565 - HSIEH; KAI-CHIEH ; et al. | 2022-05-26 |
| Board-like Connector, Single-arm Bridge Of Board-like Connector, And Wafer Testing Assembly App 20220137124 - HSIEH; KAI-CHIEH ; et al. | 2022-05-05 |
| Board-like Connector, Dual-ring Bridge Of Board-like Connector, And Wafer Testing Assembly App 20220137095 - HSIEH; KAI-CHIEH ; et al. | 2022-05-05 |
| Board-like Connector, Dual-arm Bridge Of Board-like Connector, And Wafer Testing Assembly App 20220140515 - HSIEH; KAI-CHIEH ; et al. | 2022-05-05 |
| Split thin-film probe card Grant 11,287,446 - Lee , et al. March 29, 2 | 2022-03-29 |
| Probe Card Device And Fence-like Probe Thereof App 20220018876 - LEE; WEN-TSUNG ; et al. | 2022-01-20 |
| Probe card device and fence-like probe thereof Grant 11,226,354 - Lee , et al. January 18, 2 | 2022-01-18 |
| Probe Card Device And Fan-out Probe Thereof App 20220011346 - LEE; WEN-TSUNG ; et al. | 2022-01-13 |
| Probe card device and neck-like probe thereof Grant 11,209,461 - Lee , et al. December 28, 2 | 2021-12-28 |
| Probe card device Grant 11,204,371 - Lee , et al. December 21, 2 | 2021-12-21 |
| Staggered probe card Grant 11,175,312 - Hsieh , et al. November 16, 2 | 2021-11-16 |
| Thin-film probe card and test module thereof Grant 11,175,313 - Lee , et al. November 16, 2 | 2021-11-16 |
| Thin-film Probe Card And Test Module Thereof App 20210349129 - LEE; WEN-TSUNG ; et al. | 2021-11-11 |
| Split Thin-film Probe Card And Elastic Module Thereof App 20210325430 - LEE; WEN-TSUNG ; et al. | 2021-10-21 |
| Integrated circuit with antenna in package testing apparatus Grant 11,119,139 - Chen , et al. September 14, 2 | 2021-09-14 |
| Probe card device Grant 11,073,537 - Lee , et al. July 27, 2 | 2021-07-27 |
| Probe Card Device And Directivity Probe Thereof App 20210223291 - LEE; WEN-TSUNG ; et al. | 2021-07-22 |
| Probe Card Device And Neck-like Probe Thereof App 20210223289 - LEE; WEN-TSUNG ; et al. | 2021-07-22 |
| Probe card device and rectangular probe thereof Grant 11,041,883 - Hsieh , et al. June 22, 2 | 2021-06-22 |
| Probe card device and three-dimensional signal transfer structure thereof Grant 11,009,526 - Lee , et al. May 18, 2 | 2021-05-18 |
| High speed probe card device and rectangular probe Grant 11,009,524 - Lee , et al. May 18, 2 | 2021-05-18 |
| Staggered Probe Card And Conductive Probe App 20210109129 - HSIEH; KAI-CHIEH ; et al. | 2021-04-15 |
| Probe card device and probe head Grant 10,901,001 - Hsieh , et al. January 26, 2 | 2021-01-26 |
| Integrated Circuit With Antenna In Package Testing Apparatus App 20210011069 - CHEN; Shin-tsung ; et al. | 2021-01-14 |
| Probe card device Grant 10,845,385 - Lee , et al. November 24, 2 | 2020-11-24 |
| Probe card device and matching probe thereof Grant 10,845,387 - Lee , et al. November 24, 2 | 2020-11-24 |
| Probe card device and probe head thereof Grant 10,845,388 - Lee , et al. November 24, 2 | 2020-11-24 |
| Probe Card Device And Conductive Probe Thereof App 20200300893 - LEE; WEN-TSUNG ; et al. | 2020-09-24 |
| Multilayer Circuit Board And Manufacturing Method Thereof App 20200296831 - CHEN; Yi-Chun ; et al. | 2020-09-17 |
| Multilayer circuit board and manufacturing method thereof Grant 10,779,407 - Chen , et al. Sept | 2020-09-15 |
| Probe card testing device and testing device Grant 10,775,412 - Lee , et al. Sept | 2020-09-15 |
| High Speed Probe Card Device And Rectangular Probe App 20200233014 - Lee; Wen-Tsung ; et al. | 2020-07-23 |
| Probe assembly and probe structure thereof Grant 10,718,791 - Hsieh , et al. | 2020-07-21 |
| Probe assembly and probe structure thereof Grant 10,705,117 - Lee , et al. | 2020-07-07 |
| Probe card device and rectangular probe Grant 10,670,630 - Hsieh , et al. | 2020-06-02 |
| Probe Card Device And Probe Head Thereof App 20200166543 - LEE; WEN-TSUNG ; et al. | 2020-05-28 |
| Probe Card Device And Matching Probe Thereof App 20200158756 - LEE; WEN-TSUNG ; et al. | 2020-05-21 |
| Probe card device and rectangular probe thereof Grant 10,613,117 - Chen , et al. | 2020-04-07 |
| Probe assembly and capacitive space transformer thereof Grant 10,615,768 - Hsieh , et al. | 2020-04-07 |
| Probe card device and rectangular probe thereof having ring-shaped branch segment Grant 10,605,830 - Hsieh , et al. | 2020-03-31 |
| Probe Card Testing Device And Testing Device App 20200088764 - LEE; Wen-Tsung ; et al. | 2020-03-19 |
| Probe structure Grant 10,514,390 - Li , et al. Dec | 2019-12-24 |
| Probe assembly and probe structure thereof Grant 10,509,057 - Su , et al. Dec | 2019-12-17 |
| Probe Card Device And Three-dimensional Signal Transfer Structure Thereof App 20190377004 - LEE; WEN-TSUNG ; et al. | 2019-12-12 |
| Probe Card Device And Flat Signal Transfer Structure Thereof App 20190377003 - LEE; WEN-TSUNG ; et al. | 2019-12-12 |
| Probe Card Device And Rectangular Probe Thereof App 20190324057 - CHEN; YEN-CHEN ; et al. | 2019-10-24 |
| Probe Card Device And Rectangular Probe Thereof App 20190317131 - Hsieh; Chih-Peng ; et al. | 2019-10-17 |
| Probe Card Device And Probe Head App 20190302147 - Hsieh; Chih-Peng ; et al. | 2019-10-03 |
| Probe card device and rectangular probe thereof Grant 10,401,388 - Su , et al. Sep | 2019-09-03 |
| Probe Assembly And Probe Structure Thereof App 20190265274 - LEE; WEN-TSUNG ; et al. | 2019-08-29 |
| Probe Assembly And Probe Structure Thereof App 20190265275 - HSIEH; KAI-CHIEH ; et al. | 2019-08-29 |
| Probe Card Device And Rectangular Probe App 20190227101 - Hsieh; Chih-Peng ; et al. | 2019-07-25 |
| Probe Card Device And Rectangular Probe Thereof App 20190212367 - Hsieh; Chih-Peng ; et al. | 2019-07-11 |
| Bolt type probe Grant 10,317,429 - Hsieh | 2019-06-11 |
| Probe Assembly And Engaged-type Capacitive Probe Thereof App 20190137544 - Hsieh; Chih-Peng ; et al. | 2019-05-09 |
| Probe Assembly And Capacitive Space Transformer Thereof App 20190103850 - HSIEH; CHIH-PENG ; et al. | 2019-04-04 |
| Probe Assembly And Capacitive Probe Thereof App 20190101568 - HSIEH; CHIH-PENG ; et al. | 2019-04-04 |
| Probe Card Device And Round Probe Thereof App 20190086443 - SU; WEI-JHIH ; et al. | 2019-03-21 |
| Probe Card Device And Rectangular Probe Thereof App 20190072584 - SU; WEI-JHIH ; et al. | 2019-03-07 |
| Probe Assembly And Probe Structure Thereof App 20190072586 - SU; WEI-JHIH ; et al. | 2019-03-07 |
| Support structure and manufacture method thereof Grant 10,149,384 - Su , et al. De | 2018-12-04 |
| Support Structure And Manufacture Method Thereof App 20180332704 - SU; Yung-Tai ; et al. | 2018-11-15 |
| Probe device of vertical probe card Grant 10,060,949 - Li , et al. August 28, 2 | 2018-08-28 |
| Support structure and manufacture method thereof Grant 10,021,783 - Su , et al. July 10, 2 | 2018-07-10 |
| Sliding rail type probe Grant 9,970,960 - Hsieh May 15, 2 | 2018-05-15 |
| Bolt Type Probe App 20180080955 - HSIEH; Chih-Peng | 2018-03-22 |
| Sliding Rail Type Probe App 20180074095 - HSIEH; Chih-Peng | 2018-03-15 |
| Probe Device Of Vertical Probe Card App 20180059140 - LI; Wen Tsung ; et al. | 2018-03-01 |
| Probe Structure App 20180017593 - LI; Wen Tsung ; et al. | 2018-01-18 |
| Circuit Board With Via Capacitor Structure And Manufacturing Method For The Same App 20170367183 - LI; Wen Tsung ; et al. | 2017-12-21 |
| Support Structure And Manufacture Method Thereof App 20170332490 - SU; Yung-Tai ; et al. | 2017-11-16 |
| Stack Type Test Interface Board Assembly And Method For Manufacturing The Same App 20170315152 - LIN; Cheng-Juei ; et al. | 2017-11-02 |
| Multilayer Interposer With High Bonding Strength App 20160349315 - LEE; WEN-TSUNG ; et al. | 2016-12-01 |
| Fine Pitch Interposer Structure App 20140084955 - TENG; YUAN-CHIANG ; et al. | 2014-03-27 |
| Vertical probe card Grant 8,264,249 - Lee , et al. September 11, 2 | 2012-09-11 |
| Wafer Level Testing Structure App 20120187972 - LEE; WEN-TSUNG | 2012-07-26 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 