Chung; Sang Han

Patent Applications and Registrations

Patent applications and USPTO patent grants for Chung; Sang Han.The latest application filed is for "measurement apparatus and method with adaptive scan rate".

Company Profile

0.5.7

Chung; Sang Han - Seoul KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Image acquiring method and image acquiring apparatus using the same Grant 10,133,052 - Jo , et al. November 20, 2	2018-11-20
Head limiting movement range of laser spot and atomic force microscope having the same Grant 9,645,168 - Park , et al. May 9, 2	2017-05-09
Measurement apparatus and method with adaptive scan rate Grant 9,645,169 - Jo , et al. May 9, 2	2017-05-09
Measurement Apparatus And Method With Adaptive Scan Rate App 20160356808 - JO; Ah Jin ; et al.	2016-12-08
Head Limiting Movement Range Of Laser Spot And Atomic Force Microscope Having The Same App 20160187373 - Park; Sang-iI ; et al.	2016-06-30
Image Acquiring Method And Image Acquiring Apparatus Using The Same App 20150301329 - JO; Ah Jin ; et al.	2015-10-22
Scanning probe microscope capable of measuring samples having overhang structure Grant 8,209,766 - Park , et al. June 26, 2	2012-06-26
Scanning Probe Microscope Capable Of Measuring Samples Having Overhang Structure App 20100218285 - PARK; Sang-il ; et al.	2010-08-26
Scanning Probe Microscope Capable Of Measuring Samples Having Overhang Structure App 20100170015 - PARK; Sang-il ; et al.	2010-07-01
Scanning probe microscope capable of measuring samples having overhang structure Grant 7,644,447 - Park , et al. January 5, 2	2010-01-05
Scanning Probe Microscope Capable Of Measuring Samples Having Overhang Structure App 20090200462 - PARK; Sang-il ; et al.	2009-08-13
Scanning probe microscope capable of measuring samples having overhang structure App 20080078932 - Park; Sang-il ; et al.	2008-04-03

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