Chung; Ko-Chin
Patent Applications and Registrations
Patent applications and USPTO patent grants for Chung; Ko-Chin.The latest application filed is for "display".
- Chung; Ko-Chin - Hsinchu TW
- Chung; Ko-Chin - Taipei TW
- Chung; Ko-Chin - Taipei City TW
- Chung; Ko Chin - Hsin-Chu TW
- Chung; Ko-Chin - Yung-Ho TW
| Patent | Date |
|---|---|
| Display apparatus Grant 11,177,457 - Lee , et al. November 16, 2 | 2021-11-16 |
| Display App 20210029838 - Lee; Chih-Tsung ; et al. | 2021-01-28 |
| Display Apparatus App 20200235334 - Lee; Chih-Tsung ; et al. | 2020-07-23 |
| Remote hardware inspection system and method Grant 7,873,498 - Chien , et al. January 18, 2 | 2011-01-18 |
| Remote hardware inspection system and method App 20100180157 - Chien; Wei-Yu ; et al. | 2010-07-15 |
| Optical wafer presence sensor system Grant 6,950,181 - Chen , et al. September 27, 2 | 2005-09-27 |
| Chemical vapor deposition (CVD) calibration method providing enhanced uniformity Grant 6,926,920 - Jang , et al. August 9, 2 | 2005-08-09 |
| Apparatus and method for positioning a cassette pod onto a loadport by an overhead hoist transport system Grant 6,848,882 - Chen , et al. February 1, 2 | 2005-02-01 |
| Apparatus and method for positioning a cassette pod onto a loadport by an overhead hoist transport system App 20040191042 - Chen, Ho-Jen ; et al. | 2004-09-30 |
| Optical Wafer Presence Sensor System App 20040189986 - Chen, Ho-Jen ; et al. | 2004-09-30 |
| Method of calibrating a wafer edge gripping end effector Grant 6,678,581 - Hung , et al. January 13, 2 | 2004-01-13 |
| Chemical vapor deposition (CVD) method and calibration apparatus providing enhanced uniformity App 20030226502 - Jang, Shi Sheng ; et al. | 2003-12-11 |
| Method of calibrating a wafer edge gripping end effector App 20030135302 - Hung, Kwun-Goo ; et al. | 2003-07-17 |
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